CONFERENCE PROCEEDINGS
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Paschalis Dalampiras
at NIL Technology ApS
SPIE Involvement:
Author
Publications (2)
Proceedings Article | 6 July 2018 Paper
The effect of nitrogen incorporation in boron carbide and iridium thin films
S. Massahi, F. Christensen, D. D. Ferreira, P. Dalampiras, S. Svendsen, A. Jafari
Proceedings Volume 10699, 106993Y (2018) https://doi.org/10.1117/12.2311622
KEYWORDS: Boron, Iridium, Thin films, Reflectivity, Nitrogen, X-rays, Silicon, Oxides, Sputter deposition, Oxygen
Proceedings Article | 29 August 2017 Paper
Design, development, and performance of x-ray mirror coatings for the ATHENA mission
Desiree Della Monica Ferreira, Sonny Massahi, Finn Christensen, Brian Shortt, Marcos Bavdaz, Maximilien Collon, Boris Landgraf, Nis Gellert, Jakob Korman, Paschalis Dalampiras, Ida Rasmussen, Ifikratis Kamenidis, Michael Krumrey, Swenja Schreiber
Proceedings Volume 10399, 1039918 (2017) https://doi.org/10.1117/12.2273603
KEYWORDS: Optical coatings, X-rays, Atomic force microscopy, Mirrors, Multilayers, X-ray optics, Optical design, X-ray microscopy, Reflectometry, Silicon
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