Dr. Patrick G. McNamara Profile

Dr. Patrick G. McNamara

Director of Sales at OEwaves Inc

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Publications (1)

Proceedings Article | 10 July 2003 Paper

Characterization and modeling of intradie variation and its applications to design for manufacturability

Sharad Saxena, Carlo Guardiani, Michele Quarantelli, Nicola Dragone, Sean Minehane, Patrick McNamara, Jeff Babcock

Proceedings Volume 5042, (2003) https://doi.org/10.1117/12.497477

KEYWORDS: Design for manufacturability, System on a chip, Field effect transistors, Transistors, Instrument modeling, Manufacturing, Process control, Statistical analysis, Statistical modeling, Device simulation

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