Dr. Patrick Sandoz Profile

Dr. Patrick Sandoz

Faculte des Sciences at Femto St

SPIE Involvement:

Author

Publications (23)

Proceedings Article | 17 March 2023 Presentation

Computer microvision-based precision motion measurement by digital holographic microscopy and deep transformer neural networks

Stéphane Cuenat, Jesus Brito Carcaño, Patrick Sandoz, Raphaël Couturier, Guillaume Laurent, Maxime Jacquot

Proceedings Volume PC12438, PC124380N (2023) https://doi.org/10.1117/12.2647737

KEYWORDS: Digital holography, Microscopy, Motion measurement, Transformers, Holography, Neural networks, Holograms, 3D metrology, Microscopes, Machine vision

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Proceedings Article | 24 May 2022 Presentation

Extended autofocusing capabilities in digital holographic microscopy with transformer neural networks

Louis Andréoli, Stéphane Cuenat, Antoine André, Patrick Sandoz, Raphaël Couturier, Guillaume Laurent, Maxime Jacquot

Proceedings Volume PC12136, PC1213616 (2022) https://doi.org/10.1117/12.2621467

KEYWORDS: Digital holography, Neural networks, Transformers, Microscopy, Holography, Microscopes, Holograms, Machine learning, Computing systems, 3D image reconstruction

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Proceedings Article | 9 March 2022 Presentation

Extended machine vision-control capabilities using digital holography and transformer neural networks

Louis Andréoli, Stéphane Cuenat, Antoine André, Patrick Sandoz, Raphaël Couturier, Guillaume Laurent, Maxime Jacquot

Proceedings Volume PC12019, PC1201903 (2022) https://doi.org/10.1117/12.2607116

KEYWORDS: Neural networks, Transformers, Digital holography, Machine vision, Microscopes, Holograms, Visualization, Microscopy, Machine learning, Computing systems

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Proceedings Article | 14 March 2018 Presentation

Frequency domain processing of digital holograms applied to high-accurate vision-based position control in micro-robotics (Conference Presentation)

Maxime Jacquot, Miguel Asmad Vergara, Guillaume Laurent, Patrick Sandoz

Proceedings Volume 10558, 105580I (2018) https://doi.org/10.1117/12.2287560

KEYWORDS: Digital holography, Holograms, Position sensors, Spatial light modulators, 3D image reconstruction, Imaging systems, Image processing, Solid state cameras, Wave propagation, Visual optics

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Proceedings Article | 1 July 2009 Paper

Position-referenced microscopy: regions of interest localization and subpixel image comparison by means of pseudo-random patterns embedded in cell culture boxes

July Galeano Zea, Patrick Sandoz, Laurent Robert, Emilie Gaiffe, Jean-Luc Prétet, Christiane Mougin

Proceedings Volume 7367, 736707 (2009) https://doi.org/10.1117/12.831538

KEYWORDS: Microscopy, Microscopes, Biological research, Digital imaging, Algorithm development, Optical microscopy, Visualization, Binary data, Computer programming, Human-machine interfaces

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Proceedings Article | 17 June 2009 Paper

Pseudo-periodic patterns for subpixel accuracy visual control: principle, pattern designs, and performances

July Galeano Zea, Patrick Sandoz

Proceedings Volume 7389, 73891N (2009) https://doi.org/10.1117/12.827485

KEYWORDS: Visualization, Image retrieval, Spatial frequencies, Phase measurement, Image processing, Fourier transforms, Computer programming, Actuators, Image resolution, Optical filters

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Proceedings Article | 18 June 2007 Paper

In-plane displacement measurement with sub-pixel resolution: application to vibration characterization of a shear-force scanning probe

Patrick Sandoz, Jean-Michel Friedt, Émile Carry

Proceedings Volume 6616, 66162W (2007) https://doi.org/10.1117/12.727070

KEYWORDS: Image processing, Ion beams, Phase measurement, Inspection, Fourier transforms, Image resolution, Tungsten, CCD cameras, Optical filters, Spatial frequencies

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Proceedings Article | 14 April 2006 Paper

Real-time optical coherence spectrotomography: proof of principle

L. Froehly, M. Ouadour, G. Petitjean, L. Furfaro, P. Sandoz, T. Gharbi, P. Leproux, G. Huss, V. Couderc

Proceedings Volume 6191, 61910N (2006) https://doi.org/10.1117/12.661739

KEYWORDS: Optical coherence tomography, Spectroscopy, Spectral resolution, Sensors, Diffraction gratings, Signal processing, Absorption, Light sources, Interferometers, Optical correlators

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Proceedings Article | 1 September 2005 Paper

Optical fiber sensor for allergen detection

R. Bendoula, B. Wacogne, R. Giust, F. Cherioux, P. Sandoz, T. Gharbi

Proceedings Volume 5864, 58640O (2005) https://doi.org/10.1117/12.633053

KEYWORDS: Mirrors, Reflectivity, Sensors, Optical fibers, Etching, Chemical analysis, Fiber optics sensors, Waveguides, Resistance, Biosensors

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Proceedings Article | 21 October 2004 Paper

Microstructured surface element for high-accuracy position measurement by vision and phase measurement

Patrick Sandoz, Bertrand Trolard, D. Marsaut, Tijani Gharbi

Proceedings Volume 5622, (2004) https://doi.org/10.1117/12.591686

KEYWORDS: Interferometry, Fringe analysis, Phase measurement, Optical filters, Ferroelectric materials, Software development, Signal to noise ratio, Calibration, Binary data, Image resolution

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SPIE Journal Paper | 1 January 2004

Sampling of two-dimensional images: prevention from spectrum overlap and ghost detection

Maxime Jacquot, Patrick Sandoz

OE, Vol. 43, Issue 01, (January 2004) https://doi.org/10.1117/12.10.1117/1.1630804

KEYWORDS: Digital holography, Image sensors, Sensors, Modulation transfer functions, Holograms, Linear filtering, Optical filters, Image filtering, Digital recording, Spatial frequencies

Proceedings Article | 8 October 2001 Paper

Development of a microrobot-based micropositioning station: the microrobot and its position and orientation measurement method

Sounkalo Dembele, Karima Rochdi, Patrick Sandoz, Patrice Lemoal

Proceedings Volume 4568, (2001) https://doi.org/10.1117/12.444141

KEYWORDS: Control systems, Image processing, Ultrasonics, Wavelets, Ceramics, Wavelet transforms, Ferroelectric materials, Amplifiers, Computing systems, Signal detection

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Proceedings Article | 18 August 1999 Paper

Localization method of microrobots using vision system and wavelet transform

Jean-Christophe Ravassard, Sounkalo Dembele, Patrick Sandoz, Andre Janex, Nadine Piat

Proceedings Volume 3834, (1999) https://doi.org/10.1117/12.357827

KEYWORDS: Wavelet transforms, Mobile robots, Wavelets, CCD cameras, Cameras, Microscopes, Signal processing, Fourier transforms, Robotics, Calibration

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Proceedings Article | 6 July 1999 Paper

White light interferometry: innovative algorithms and performances

Patrick Sandoz, Jose Calatroni, Gilbert Tribillon

Proceedings Volume 3572, (1999) https://doi.org/10.1117/12.358362

KEYWORDS: Interferometers, Optical interferometry, Photodetectors, Spectroscopy, Light sources, Interferometry, Fringe analysis, Mirrors, Fourier transforms, Colorimetry

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Proceedings Article | 17 September 1997 Paper

Processing of white-light correlograms: simultaneous phase and envelope measurements by wavelet transformation

Patrick Sandoz, Maxime Jacquot

Proceedings Volume 3098, (1997) https://doi.org/10.1117/12.281147

KEYWORDS: Wavelets, Phase measurement, Light sources, Phase shifts, Mirrors, Optical interferometry, Interferometry, Interferometers, Fringe analysis, Ferroelectric materials

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Proceedings Article | 18 September 1996 Paper

Double spectral modulation for surface analysis

Jose Calatroni, Patrick Sandoz, Gilbert Tribillon, Herve Perrin

Proceedings Volume 2782, (1996) https://doi.org/10.1117/12.250765

KEYWORDS: Modulation, Phase shift keying, Data processing, 3D image processing, 3D image reconstruction, Phase interferometry, Optical interferometry, Spectroscopy, Interferometry, Diffraction gratings

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Proceedings Article | 18 September 1996 Paper

Linear approximation of the coherence function of a white-light source for efficient phase-shifting interferometry

Patrick Sandoz

Proceedings Volume 2782, (1996) https://doi.org/10.1117/12.250772

KEYWORDS: Phase interferometry, Light sources, Interferometry, Optical interferometry, Data acquisition, Phase shifting, Algorithm development

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Proceedings Article | 23 June 1995 Paper

Optical implementation of frequency domain analysis for white-light interferometry

Patrick Sandoz, Herve Perrin, Gilbert Tribillon, Jose Calatroni, Antonio Guerrero, Carmen Sainz, Raphael Esacalona

Proceedings Volume 2545, (1995) https://doi.org/10.1117/12.212650

KEYWORDS: Phase shift keying, Phase measurement, Optical interferometry, Phase interferometry, Light sources, Modulation, Spectroscopy, Phase shifting, Inspection, Statistical analysis

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Proceedings Article | 12 December 1994 Paper

Profilometry by spectral encoding of the optical axis

Herve Perrin, Patrick Sandoz, Gilbert Tribillon

Proceedings Volume 2340, (1994) https://doi.org/10.1117/12.195933

KEYWORDS: Fresnel lenses, Objectives, Light sources, Confocal microscopy, Computer programming, Inspection, Mirrors, Head, Calibration, Spectroscopes

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Proceedings Article | 15 November 1994 Paper

Brightness measurement of rough surfaces by confocal microscopy and image analysis

Patrick Sandoz, Gilbert Tribillon

Proceedings Volume 2248, (1994) https://doi.org/10.1117/12.194307

KEYWORDS: Skin, Confocal microscopy, Visibility, Scattering, Linear filtering, Objectives, Eye, Reflection, Image analysis, Control systems

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Proceedings Article | 1 March 1994 Paper

Profilometry by white light autocorrelation function sampling

Patrick Sandoz

Proceedings Volume 2004, (1994) https://doi.org/10.1117/12.172610

KEYWORDS: Interferometry, Mirrors, Light sources, Interferometers, Silicon, Confocal microscopy, Nanoimprint lithography, Phase shifting, Profilometers, Ferroelectric materials

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Proceedings Article | 1 December 1993 Paper

Scattering properties of very rough surfaces: application to brightness measurement of common objects

Patrick Sandoz, Gilbert Tribillon

Proceedings Volume 1995, (1993) https://doi.org/10.1117/12.162652

KEYWORDS: Scattering, Skin, Visualization, Statistical analysis, Visual analytics, Reflection, Image processing, Light scattering, Microscopes, Tissue optics

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The visual aspect of products meant for the general public is becoming an equally important criterium for their commercial success as their technical qualities and their cost. In most cases, the aesthetic quality of products is visually assessed by experienced people whose judgement is considered as a reference.This procedure has two major disadvantages: i) This visual estimation is entirely related to individual sensitivity and cannot be quantified. Only a comparative analysis is possible and requires a sufficient range of reference samples which are indispensable for this evaluation. ii) This visual evaluation concerns the global evaluation of the appearance and cannot dissociate with entire precision the roles of different parametres such as the color, the luminosity, the form and the shine of the surface. .. It is therefore rather difficult to point out possible modifications that could be brought to the process of fabrication in order to improve the aesthetic quality of the products. To be freed from the restrictions of visual inspection, the industrial world tries to endow itself with systematic procedures and instruments for physical measurement that evaluate the visual aspect of the surfaces. The study that we propose here belongs to this field of research, and applies more particularly to the measuring of the brightness of plastic pieces the surface of which presents an undulation of less than a millimetre deep (skin profile). In the first part of this study, we shallpropose a systematic analysis of visual aspect which four different and independant criteria defines. We shall explain why traditional methods for the measurement of scattering cannot be applied to such wavy surfaces. The material BRDF (Bidirectionnal Reflection Distribution Function) must be estimated from the analysis of their roughness by the means of established scattering models, such as that of Beckmann and Spizzichino. Secondly we shall introduce the procedure that we have developed in order to analyze the visual aspect of plastic samples, through confocal microscopy and image processing. A low magnification analysis allows one to measure the skin contours of the surfaces and to infer the local surface orientation which determines the exact values of the incidence and observation angles. A second analysis, with high magnification and an adequate image processing software, enables the extraction of the microroughness responsible for the scattering, and one can then evaluate the scattering properties of the material. Finally,the combination of the properties of scattering and of the local orientation of the surface allows the prediction of the degree of visibility of the skin profile of the surface. The statistical distribution of the measured parametres is also taken into account.

Proceedings Article | 1 January 1991 Paper

Multichannel chromatic interferometry: metrology applications

Gilbert Tribillon, Jose Calatroni, Patrick Sandoz

Proceedings Volume 1332, (1991) https://doi.org/10.1117/12.51115

KEYWORDS: Modulation, Colorimetry, Optical testing, Coherence (optics), Optical inspection, Spectral resolution, Spectroscopes, Optical filters, Metrology, Light sources

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Showing 5 of 23 publications

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