Dr. Qingying Jim Hu Profile

Dr. Qingying Jim Hu

Principal Investigator at Qi2

SPIE Involvement:

Author

Proceedings Article | 14 September 2011 Paper

Modeling, error analysis, and compensation in phase-shifting surface profilers

Qingying Jim Hu

Proceedings Volume 8133, 81330L (2011) https://doi.org/10.1117/12.894594

KEYWORDS: Phase shifts, Calibration, Profilometers, Projection systems, Phase shifting, Error analysis, Cameras, Optical metrology, 3D metrology, Fringe analysis

Read Abstract +

Proceedings Article | 11 November 2010 Paper

Optical system design for crack inspections using magneto-optical imaging

Qingying Hu, Richard Dougherty, Phil Bondurant

Proceedings Volume 7855, 78550A (2010) https://doi.org/10.1117/12.870050

KEYWORDS: Inspection, Polarization, Nondestructive evaluation, Optical inspection, Magnetism, Imaging systems, Sensors, Optical design, Image analysis, Sensing systems

Read Abstract +

Proceedings Article | 10 October 2007 Paper

Multiple views merging from different cameras in fringe-projection based phase-shifting method

Qingying Hu, Kevin Harding, Don Hamilton, Jay Flint

Proceedings Volume 6762, 676207 (2007) https://doi.org/10.1117/12.735040

KEYWORDS: Cameras, Calibration, Projection systems, Imaging systems, Phase shifts, Inspection, Sensors, Computing systems, 3D modeling, Distortion

Read Abstract +

Proceedings Article | 26 September 2007 Paper

Smooth 3D edge detection in scarfed composite surfaces

Rajesh Ramamurthy, Megha Navalgund, Qingying Hu, Kevin Harding

Proceedings Volume 6762, 676202 (2007) https://doi.org/10.1117/12.732136

KEYWORDS: 3D image processing, Cameras, Composites, 3D metrology, Edge detection, Image processing, Phase shifts, Error analysis, Diffractive optical elements, Light sources

Read Abstract +

Proceedings Article | 12 October 2006 Paper

Multiresolution 3D measurement using a hybrid fringe projection and moire approach

Kevin Harding, Qingying Hu

Proceedings Volume 6382, 63820K (2006) https://doi.org/10.1117/12.687183

KEYWORDS: Moire patterns, Projection systems, Cameras, Phase shifts, 3D metrology, LCDs, Imaging systems, Sensors, Phase measurement, Fringe analysis

Read Abstract +

Proceedings Article | 12 October 2006 Paper

Edge measurement using stereovision and phase-shifting methods

Qingying Hu, Kevin Harding, Don Hamilton

Proceedings Volume 6382, 63820C (2006) https://doi.org/10.1117/12.685423

KEYWORDS: Cameras, LED lighting, Phase shifts, Light emitting diodes, Clouds, Image processing, Projection systems, 3D metrology, Imaging systems, 3D image processing

Read Abstract +

Proceedings Article | 7 November 2005 Paper

Shiny parts measurement using color separation

Qingying Hu, Kevin Harding, Xiaoming Du, Don Hamilton

Proceedings Volume 6000, 60000D (2005) https://doi.org/10.1117/12.629942

KEYWORDS: Cameras, Polarizers, Clouds, Optical filters, Inspection, Polarization, Image segmentation, Projection systems, Image processing, Phase shifting

Read Abstract +

Proceedings Article | 16 December 2004 Paper

Image bias correction in structured light sensor

Qingying Hu, Kevin Harding, Donald Hamilton

Proceedings Volume 5606, (2004) https://doi.org/10.1117/12.571683

KEYWORDS: Sensors, Cameras, Clouds, Image sensors, Calibration, Optical testing, 3D image processing, Sensor calibration, Data centers, Structured light

Read Abstract +

SPIE Journal Paper | 1 February 2003

Calibration of a three-dimensional shape measurement system

Qingying Hu, Peisen Huang, Qionglin Fu, Fu-Pen Chiang

OE, Vol. 42, Issue 02, (February 2003) https://doi.org/10.1117/12.10.1117/1.1531977

KEYWORDS: Calibration, Fringe analysis, Cameras, Digital micromirror devices, Imaging systems, 3D metrology, Algorithm development, Distance measurement, Phase shifting, Phase shifts

SPIE Journal Paper | 1 February 2003

Error compensation for a three-dimensional shape measurement system

Peisen Huang, Qingying Hu, Fu-Pen Chiang

OE, Vol. 42, Issue 02, (February 2003) https://doi.org/10.1117/12.10.1117/1.1531636

KEYWORDS: Error analysis, 3D metrology, Projection systems, Calibration, Fringe analysis, Cameras, Phase shifting, Imaging systems, Optical engineering, Mechanical engineering

Proceedings Article | 16 November 1999 Paper

Calibration of a 3D surface contouring and ranging system

Qingying Hu, Peisen Huang, Qionglin Fu, Fu-Pen Chiang

Proceedings Volume 3835, (1999) https://doi.org/10.1117/12.370256

KEYWORDS: Calibration, Fringe analysis, Digital micromirror devices, Ranging, Algorithm development, 3D metrology, Phase shift keying, Phase shifts, Cameras, Distance measurement

Read Abstract +

SPIE Journal Paper | 1 June 1999

Color-encoded digital fringe projection technique for high-speed 3-D surface contouring

Peisen Huang, Qingying Hu, Feng Jin, Fu-Pen Chiang

OE, Vol. 38, Issue 06, (June 1999) https://doi.org/10.1117/12.10.1117/1.602151

KEYWORDS: Fringe analysis, Cameras, RGB color model, Projection systems, 3D image processing, Phase shift keying, Digital Light Processing, Digital micromirror devices, Modulation, Phase shifts

Proceedings Article | 29 September 1998 Paper

Color-encoded fringe projection and phase shifting for 3D surface contouring

Peisen Huang, Qingying Hu, Feng Jin, Fu-Pen Chiang

Proceedings Volume 3407, (1998) https://doi.org/10.1117/12.323359

KEYWORDS: Fringe analysis, Projection systems, Cameras, RGB color model, Phase shifting, 3D image processing, Digital imaging, Phase shift keying, Digital micromirror devices, Modulation

Read Abstract +

Showing 5 of 13 publications

Conference Committee Involvement (12)

Optical Metrology and Inspection for Industrial Applications V

11 October 2018 | Beijing, China

Optical Metrology and Inspection for Industrial Applications IV

12 October 2016 | Beijing, China

Optical Metrology and Inspection for Industrial Applications III

9 October 2014 | Beijing, China

Dimensional Optical Metrology and Inspection for Practical Applications III

5 May 2014 | Baltimore, MD, United States

Dimensional Optical Metrology and Inspection for Practical Applications II

25 August 2013 | San Diego, California, United States

Showing 5 of 12 Conference Committees

Keywords/Phrases

Search In:

Publication Years