We present measurements of light scatter induced by a new ultrafast laser technique being developed for laser refractive correction in transparent ophthalmic materials such as cornea, contact lenses, and/or intraocular lenses. In this new technique, called intra-tissue refractive index shaping (IRIS), a 405 nm femtosecond laser is focused and scanned below the corneal surface, inducing a spatially-varying refractive index change that corrects vision errors. In contrast with traditional laser correction techniques, such as laser in-situ keratomileusis (LASIK) or photorefractive keratectomy (PRK), IRIS does not operate via photoablation, but rather changes the refractive index of transparent materials such as cornea and hydrogels. A concern with any laser eye correction technique is additional scatter induced by the process, which can adversely affect vision, especially at night. The goal of this investigation is to identify sources of scatter induced by IRIS and to mitigate possible effects on visual performance in ophthalmic applications. Preliminary light scattering measurements on patterns written into hydrogel showed four sources of scatter, differentiated by distinct behaviors: (1) scattering from scanned lines; (2) scattering from stitching errors, resulting from adjacent scanning fields not being aligned to one another; (3) diffraction from Fresnel zone discontinuities; and (4) long-period variations in the scans that created distinct diffraction peaks, likely due to inconsistent line spacing in the writing instrument. By knowing the nature of these different scattering errors, it will now be possible to modify and optimize the design of IRIS structures to mitigate potential deficits in visual performance in human clinical trials.
In this proceedings, we present a 3DoF (one linear, two angular) optical probe for measuring freeform optics in conjunction with an optical coordinate measuring machine (OCMM). This probe uses homodyne interferometry in a Michelson configuration and position sensing detection to simultaneously measure displacement, tip, and tilt. The goal of this work is to investigate point-to-point methods for measuring freeform optics and establish a probing methodology that can perform self-alignment with respect to the local optical surface. We present the design and preliminary benchtop validation of the probe's performance. Benchtop validation shows successful measurements with 5 nm linear and 20 μrad angular noise levels, with a 15 μm spot size. A CMOS sensor is used for visual confirmation of proper focus on measurement surface to minimize initial defocus error. A PSD detects linear horizontal and vertical displacement of the reflected beam from the measurement surface using autocollimation. In-phase and quadrature signals are measured by two photodetectors and post-processed to obtain displacement information. Periodic error caused by polarization effects and beam mixing is compensated by FPGA-based signal processing.
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