We have analyzed microstructures of perovskite layers deposited with different composition by controlling X-ray incident angle from 0.05 to 0.5, corresponding to near-surface and full-depth from surface, respectively. The patterns in the perovskite layers will be discussed in detail by combing with a high resolution TEM. In addition, alternative materials for electron- and hole-transporting layers will be introduced, because it would be important to solve several practical issues such as stability and flexibility. Sn-based oxides for the use in electron-transporting layer (ETL) and a low temperature solution-processed copper thiocyanate (CuSCN) as an inorganic HTL were applied to PSCs
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