Dr. Spyros Gallis (Spyridon Galis) is an Associate Professor in the University at Albany's College of Nanotechnology, Science, and Engineering (CNSE). He was a senior engineer at International Business Machines (IBM) Microelectronics’ Semiconductor Research and Development Center (SRDC) (2006 – 2014). He received his Ph.D. degree in Nanoscale Science from SUNY Albany (New York). His research directions focus to advance fundamental understanding and the experimental knowledge for the development of new scalable nanostructured materials and novel 2D materials for emerging nanoscale applications, and quantum sources for telecom quantum network technologies deeply impacting our lives as we are moving towards the fourth industrial revolution. Concurrently, his semiconductor-related research focuses are the advanced CMOS chip process integration and characterization, as well as physical failure analysis (PFA) and the development of defect localization methodologies for CMOS technologies. He has a strong grasp of the tools, methodologies and characterization used in thin-film deposition science and technology. He has become a recognized expert in his fields (PFA, silicon oxycarbide and rare-earth oxide related materials) and has served as paper reviewer for several journals.