Stephen J. Bruner
at NuSil Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 8 December 2004 Paper
Bill Riegler, Stephen Bruner, Randall Elgin
Proceedings Volume 5590, (2004) https://doi.org/10.1117/12.568157
KEYWORDS: Silicon, Polymers, Refractive index, Resistance, Optics manufacturing, Chemistry, Sensors, Platinum, Electronics, Temperature metrology

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