Prof. Taketoshi Matsumoto Profile

Prof. Taketoshi Matsumoto

SPIE Involvement:

Author

Publications (2)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 18 December 2018 Paper

Microstructure and optical properties of black silicon layers

Stanislav Jurečka, Martin Králik, Emil Pinčík, Kentaro Imamura, Taketoshi Matsumoto, Hikaru Kobayashi

Proceedings Volume 10976, 109760I (2018) https://doi.org/10.1117/12.2518368

KEYWORDS: Silicon, Reflectivity, Etching, Transmission electron microscopy, Refraction, Optical properties, Spectral models, Dielectrics, Platinum, Optical analysis

Read Abstract +

Black silicon structures were formed by etching of silicon substrates based on the surface structure chemical transfer method. Formed structures show gradient of material density in the nanocrystalline Si layer leading to ultralow spectral reflectance below 3% in wide spectral region. In study of the development of microstructure properties during the forming procedure the TEM images were used. Information abut the microstructure observed in the TEM images was analysed by the Abbott-Firestone method. By using this approach limiting conditions for the black silicon layer formation were obtained. Spectral reflectances of studied samples were modelled by using the effective medium theory. Multilayer theoretical model based on splitting the black silicon layer into 20 sublayers was constructed. Optical properties of each individual sublayer were described by using Bruggeman effective media theory combining Si, SiO₂ and void fractions. Gradual development of real and imaginary part of complex index of refraction was observed in the volume of black silicon layers. Results of optical analysis correspond to the microstructure development during sample forming.

Proceedings Article | 1 December 2017 Paper

Reflectance analysis of porosity gradient in nanostructured silicon layers

Stanislav Jurečka, Kentaro Imamura, Taketoshi Matsumoto, Hikaru Kobayashi

Proceedings Volume 10603, 106031B (2017) https://doi.org/10.1117/12.2292723

KEYWORDS: Reflectivity, Nanostructuring, Silicon

Read Abstract +

In this work we study optical properties of nanostructured layers formed on silicon surface. Nanostructured layers on Si are formed in order to reach high suppression of the light reflectance. Low spectral reflectance is important for improvement of the conversion efficiency of solar cells and for other optoelectronic applications. Effective method of forming nanostructured layers with ultralow reflectance in a broad interval of wavelengths is in our approach based on metal assisted etching of Si. Si surface immersed in HF and H2O2 solution is etched in contact with the Pt mesh roller and the structure of the mesh is transferred on the etched surface. During this etching procedure the layer density evolves gradually and the spectral reflectance decreases exponentially with the depth in porous layer. We analyzed properties of the layer porosity by incorporating the porosity gradient into construction of the layer spectral reflectance theoretical model. Analyzed layer is splitted into 20 sublayers in our approach. Complex dielectric function in each sublayer is computed by using Bruggeman effective media theory and the theoretical spectral reflectance of modelled multilayer system is computed by using Abeles matrix formalism. Porosity gradient is extracted from the theoretical reflectance model optimized in comparison to the experimental values. Resulting values of the structure porosity development provide important information for optimization of the technological treatment operations.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

;

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years