Dr. Thomas Y. Wu Profile

Dr. Thomas Y. Wu

at National Metrology Ctr

SPIE Involvement:

Author

Publications (2)

Proceedings Article | 18 June 2024 Poster + Paper

Patrice Salzenstein, Thomas Wu

Proceedings Volume 12997, 129971H (2024) https://doi.org/10.1117/12.3022390

KEYWORDS: Light scattering, Measurement uncertainty, Laser scattering, Interferometers, Polymethylmethacrylate

Proceedings Article | 27 November 2023 Paper

Patrice Salzenstein, Thomas Wu

Proceedings Volume 12760, 127600M (2023) https://doi.org/10.1117/12.2689285

KEYWORDS: Measurement uncertainty, Light scattering, Interferometers, Polymethylmethacrylate, Uncertainty analysis

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases