Dr. Vladimir N. Polkovnikov Profile

Dr. Vladimir N. Polkovnikov

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Publications (6)

SPIE Journal Paper | 10 April 2021 Open Access

Optical constants of beryllium thin layers determined from Mo/Be multilayers in spectral range 90 to 134 eV

Mewael Giday Sertsu, Andrey Sokolov, Nikolay Chkhalo, Vladimir Polkovnikov, Nikolay Salashchenko, Mikhail Svechnikov, Franz Schäfers

OE, Vol. 60, Issue 04, 044103, (April 2021) https://doi.org/10.1117/12.10.1117/1.OE.60.4.044103

KEYWORDS: Beryllium, Extreme ultraviolet, Reflectivity, Multilayers, Silicon, Absorption, X-rays, Silicon carbide, Molybdenum, Reflectometry

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SPIE Journal Paper | 5 February 2018

Collimator based on a Schmidt camera mirror design and its application to the study of the wide-angle UV and VUV telescope

Nikolay Chkhalo, Ilya Malyshev, Alexey Pestov, Vladimir Polkovnikov, Nikolay Salashchenko, Mikhail Toropov, Sergey Vdovichev, Igor Leonardovich Strulya, Jurii Plastinin, Artem Rizvanov

JATIS, Vol. 4, Issue 01, 014003, (February 2018) https://doi.org/10.1117/12.10.1117/1.JATIS.4.1.014003

KEYWORDS: Collimators, Mirrors, Telescopes, Spherical lenses, Cameras, Vacuum ultraviolet, Ultraviolet radiation, Ultraviolet telescopes, Monochromatic aberrations, Optical instrument design

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Proceedings Article | 31 May 2017 Paper

Deformation-free rim for the primary mirror of telescope having sub-second resolution

I. Malyshev, N. Chkhalo, M. Toropov, N. Salashchenko, A. Pestov, S. Kuzin, V. Polkovnikov

Proceedings Volume 10235, 102350C (2017) https://doi.org/10.1117/12.2269433

KEYWORDS: Sun, Interferometers, Missiles, Bridges, Epoxies, Adhesives, Temperature metrology, Extreme ultraviolet, X-ray optics, Mirrors, Space telescopes, Ultraviolet telescopes, Telescopes, Interferometry, Astronomical imaging, EUV optics, Optical testing

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Proceedings Article | 31 May 2017 Paper

High-aperture monochromator-reflectometer and its usefulness for CCD calibration

Eugene Vishnyakov, Alexander Shcherbakov, Andrei Pertsov, Vladimir Polkovnikov, Alexey Pestov, Dmitry Pariev, Nikolai Chkhalo

Proceedings Volume 10235, 102350W (2017) https://doi.org/10.1117/12.2264814

KEYWORDS: Charge-coupled devices, X-rays, Calibration, Mirrors, Objectives, Thin films, Optical filters, Multilayers, Reflectometry, Monochromators, EUV optics, Sensors, Plasma, Photons, Extreme ultraviolet

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Proceedings Article | 31 May 2017 Presentation + Paper

Effect of ion beam etching on the surface roughness of bare and silicon covered beryllium

N. Chkhalo, M. Mikhaylenko, A. Mil'kov, A. Pestov, V. Polkovnikov, N. Salashchenko, I. Strulya, M. Zorina, S. Yu. Zuev

Proceedings Volume 10235, 102350M (2017) https://doi.org/10.1117/12.2269312

KEYWORDS: Beryllium, Surface roughness, Etching, Ions, Polishing, Neon, Ion beams, Silicon, X-rays, Extreme ultraviolet, Reflectivity, Mirrors, Reflection

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Proceedings Article | 30 December 2016 Paper

Problems and prospects of maskless (B)EUV lithography

N. Chkhalo, V. Polkovnikov, N. Salashchenko, M. Toropov

Proceedings Volume 10224, 102241O (2016) https://doi.org/10.1117/12.2267125

KEYWORDS: Lithography, Extreme ultraviolet lithography, Microelectromechanical systems, Mirrors, Micromirrors, Reflectivity, Reflection, Multilayers, X-rays, Semiconducting wafers

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Showing 5 of 6 publications

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