Dr. Wende Liu
at National Institute of Metrology
SPIE Involvement:
Author
Area of Expertise:
optical metrology , ellipsometry , radiometry
Publications (22)

Proceedings Article | 20 November 2024 Poster + Paper
Yikang Gong, Wende Liu, Haiyong Gan, Yuanrui Dong, Zhe Peng, Zuo Chen
Proceedings Volume 13241, 1324119 (2024) https://doi.org/10.1117/12.3036430
KEYWORDS: Cameras, Imaging systems, Machine vision, Light sources and illumination, Digital cameras, Image resolution, Spatial resolution, Signal to noise ratio

Proceedings Article | 30 April 2024 Paper
Proceedings Volume 13156, 131561I (2024) https://doi.org/10.1117/12.3019867
KEYWORDS: Solar cells, Computer simulations, Object detection, Electroluminescence, Defect detection

Proceedings Article | 30 April 2024 Paper
Proceedings Volume 13153, 131531K (2024) https://doi.org/10.1117/12.3020162
KEYWORDS: Sensors, Imaging systems, Image sensors, Cameras, Measurement uncertainty

Proceedings Article | 30 April 2024 Paper
Qi Zang, Shaozhe Cui, Weijie Wang, Tao Liang, Xiaolu Zhan, Wende Liu, Yingwei He, Zhengang Lu, Haiyong Gan
Proceedings Volume 13153, 1315318 (2024) https://doi.org/10.1117/12.3018684
KEYWORDS: Laser scanners, Galvanometers, Calibration, Mirrors, Beam controllers, Servomechanisms, Light sources and illumination, Laser frequency, Beam steering, Scanners

Proceedings Article | 21 December 2023 Paper
Wende Liu, Yadong Chen, Taotao Zhang, Zuo Chen, Haiyong Gan, Junchao Zhang, Chuan Cai, Limin Xiong
Proceedings Volume 12966, 129660L (2023) https://doi.org/10.1117/12.3005643
KEYWORDS: Object detection, Photovoltaics, Defect detection, Electroluminescence, Image resolution, Machine vision, Cameras

Showing 5 of 22 publications
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