Dr. Werner H. Jark Profile

Dr. Werner H. Jark

at Elettra - Sincrotrone Trieste SCpA

SPIE Involvement:

Author

Publications (21)

Proceedings Article | 21 August 2020 Presentation

Conditions in which off-plane diffraction can efficiently provide high spectral resolving power in EUV/soft x-ray monochromators

Werner Jark

Proceedings Volume 11491, 1149107 (2020) https://doi.org/10.1117/12.2568660

KEYWORDS: Diffraction, Spectral resolution, X-rays, Diffraction gratings, X-ray diffraction, Micromirrors, Spectrometers, Mirrors, Synchrotrons

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Proceedings Article | 9 September 2019 Presentation + Paper

Revisited grating efficiency maps: predicting diffraction grating performance by use of image analysis programs

W. Jark

Proceedings Volume 11108, 111080K (2019) https://doi.org/10.1117/12.2529250

KEYWORDS: Diffraction gratings, Image analysis, Diffraction, X-ray diffraction, X-rays, Monochromators, Optical design

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Proceedings Article | 22 December 2016 Presentation

A monochromator for tuning the photon energy range 600 eV and 6000 eV with a single dispersing optical element (Conference Presentation)

Werner Jark

Proceedings Volume 9963, 996305 (2016) https://doi.org/10.1117/12.2236513

KEYWORDS: Diffraction gratings, X-rays, Monochromators, X-ray diffraction, Diffraction, Reflection, Crystals, Switches, Optical components, Mirrors

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Proceedings Article | 2 November 2016 Presentation

Amplitude beam splitting of x-rays (Conference Presentation)

Werner Jark, Diane Eichert

Proceedings Volume 9964, 99640C (2016) https://doi.org/10.1117/12.2238621

KEYWORDS: X-rays, Diffraction gratings, X-ray diffraction, Beam splitters, Diffraction, X-ray optics, X-ray sources, Alternate lighting of surfaces, Current controlled current source

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Proceedings Article | 17 September 2014 Paper

Proposal for a source size and source position monitor for high power x-ray sources based on a "negative" pin-hole camera

Werner Jark

Proceedings Volume 9210, 92100L (2014) https://doi.org/10.1117/12.2062567

KEYWORDS: Prisms, Refraction, X-rays, Interfaces, Radiography, X-ray sources, Sensors, Refractive index, Grazing incidence, Diffraction

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Proceedings Article | 5 September 2014 Paper

Optimisation of a compact optical system for the beamtransport at the x-ray fluorescence beamline at Elettra for experiments with small spots

Werner Jark, Diane Eichert, Lars Luehl, Alessandro Gambitta

Proceedings Volume 9207, 92070G (2014) https://doi.org/10.1117/12.2063009

KEYWORDS: Mirrors, Crystals, Monochromators, Grazing incidence, Collimation, Multilayers, Laser crystals, Spectral resolution, X-rays, Photonic crystals

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Proceedings Article | 5 September 2014 Paper

Focusing x-rays in two dimensions upon refraction in an inclined prism

Werner Jark, Gianluca Grenci

Proceedings Volume 9207, 92070A (2014) https://doi.org/10.1117/12.2062569

KEYWORDS: X-rays, Interfaces, Refraction, Prisms, Grazing incidence, X-ray optics, Refractive index, Spatial resolution, X-ray imaging, Absorption

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Proceedings Article | 27 September 2013 Paper

High-speed photon energy tuning of x-rays with high duty cycle by use of Clessidra prism arrays

Werner Jark, Arndt Last, Ottó Márkus

Proceedings Volume 8848, 884806 (2013) https://doi.org/10.1117/12.2023921

KEYWORDS: Prisms, Monochromators, X-rays, Dispersion, Spectral resolution, Refraction, Refractive index, Interfaces, X-ray optics, High speed photonics

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Proceedings Article | 3 May 2013 Paper

Concepts for rapid tuning and switching of x-ray energies

Werner Jark, Arndt Last

Proceedings Volume 8777, 877712 (2013) https://doi.org/10.1117/12.2017446

KEYWORDS: Prisms, Monochromators, X-rays, Spectral resolution, Refraction, Switching, Dispersion, Refractive index, Chromatic aberrations, X-ray optics

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Proceedings Article | 19 October 2012 Paper

Bunch by bunch beam monitoring in 3rd and 4th generation light sources by means of single crystal diamond detectors and quantum well devices

M. Antonelli, M. Di Fraia, A. Tallaire, J. Achard, S. Carrato, R. Menk, G. Cautero, D. Giuressi, W. Jark, G. Biasiol, T. Ganbold, K. Oliver, C. Callegari, M. Coreno, A. De Sio, E. Pace

Proceedings Volume 8504, 85040D (2012) https://doi.org/10.1117/12.929668

KEYWORDS: Sensors, Diamond, Free electron lasers, Quantum wells, X-rays, Electrodes, Ultraviolet radiation, Extreme ultraviolet, Light sources, X-ray detectors

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Proceedings Article | 28 September 2011 Paper

High spatial resolution with zoomable saw-tooth refractive lenses?

Werner Jark

Proceedings Volume 8139, 81390W (2011) https://doi.org/10.1117/12.893946

KEYWORDS: Lenses, Prisms, Diffraction, Spatial resolution, X-rays, Polymethylmethacrylate, Geometrical optics, Beryllium, Silicon, Image resolution

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Proceedings Article | 28 September 2011 Paper

Revisiting the "forgotten" first zoomable refractive x-ray lens

Werner Jark, Luigi Rigon, Kevin Oliver

Proceedings Volume 8139, 81390G (2011) https://doi.org/10.1117/12.896425

KEYWORDS: Prisms, X-rays, Interfaces, Diffraction, Refraction, Spectroscopy, Beryllium, Grazing incidence, Sensors, Diamond

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Proceedings Article | 3 September 2008 Paper

The role of spatial coherence, diffraction and refraction in the focusing of x-rays with prism arrays of the Clessidra type

W. Jark, M. Matteucci, R. Menk, L. Rigon, L. De Caro

Proceedings Volume 7077, 70771X (2008) https://doi.org/10.1117/12.804383

KEYWORDS: Prisms, Diffraction, Refraction, Radiography, Lenses, CCD cameras, X-rays, X-ray diffraction, Phase shifts, Spatial coherence

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Proceedings Article | 3 September 2008 Paper

X-ray prism lenses with large apertures

M. Simon, E. Reznikova, V. Nazmov, A. Last, W. Jark

Proceedings Volume 7077, 70771Q (2008) https://doi.org/10.1117/12.795423

KEYWORDS: X-rays, Lenses, Prisms, Photomasks, Transparency, X-ray lithography, X-ray sources, Absorption, X-ray optics, Polymethylmethacrylate

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Proceedings Article | 4 November 2004 Paper

Focusing hard x-rays with large kinoform lenses of mm size

Werner Jark, Frederic Perennes, Marco Matteucci, Lucia Mancini, Francesco Montanari, Luigi Rigon, Giuliana Tromba, Andrea Somogyi, Remi Tucoulou, Sylvain Bohic

Proceedings Volume 5539, (2004) https://doi.org/10.1117/12.556660

KEYWORDS: Lenses, Prisms, Diffraction, Fresnel lenses, Silicon, Sensors, X-ray lithography, X-rays, Refraction, Zone plates

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Proceedings Article | 4 November 2004 Paper

Transmission calculations for one- and two-dimensional x-ray waveguides

Werner Jark, Silvia Di Fonzo

Proceedings Volume 5539, (2004) https://doi.org/10.1117/12.556661

KEYWORDS: Waveguides, X-rays, Absorption, Beryllium, Interfaces, Mirrors, Chromium, Thin films, Microscopy, X-ray microscopy

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Proceedings Article | 1 November 1997 Paper

Experimental multilayer survey in the VUV

Franz Schaefers, Hans-Christoph Mertins, M. Mertin, Ingo Packe, F. Schmolla, Silvia Di Fonzo, G. Soullie, Werner Jark, Hans Grimmer, Peter Boeni, Daniel Clemens, Michael Horisberger, Nikolai Salashchenko, E. Shamov

Proceedings Volume 3152, (1997) https://doi.org/10.1117/12.295560

KEYWORDS: Reflectivity, Absorption, Chromium, X-rays, Mirrors, Synchrotron radiation, Polarimetry, Sensors, Iron, Nickel

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Proceedings Article | 1 November 1997 Paper

High-resolution phase contrast microscopy with a hard x-ray waveguide

Alessia Cedola, Peter Cloetens, Silvia Di Fonzo, Werner Jark, Stefano Lagomarsino, G. Soullie, Christian Riekel

Proceedings Volume 3154, (1997) https://doi.org/10.1117/12.279388

KEYWORDS: Waveguides, Phase contrast, X-rays, Hard x-rays, Sensors, Microscopy, Image resolution, X-ray imaging, Absorption, Microscopes

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Proceedings Article | 22 November 1996 Paper

Advantages of in-situ LTP distortion profile test on high heat load mirrors and applications

Shinan Qian, Werner Jark, Giovanni Sostero, Alessandro Gambitta, Fabio Mazzolini, Adolfo Savoia

Proceedings Volume 2856, (1996) https://doi.org/10.1117/12.259870

KEYWORDS: Mirrors, Distortion, Synchrotron radiation, Interferometers, Head, Synchrotrons, Wavefront sensors, Optical testing, Optical components, Adaptive optics

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SPIE Journal Paper | 1 February 1995

In situ surface profiler for high heat load mirror measurement

Shinan Qian, Werner Jark, Peter Takacs, Kevin Randall, Wenbing Yun

OE, Vol. 34, Issue 02, (February 1995) https://doi.org/10.1117/12.10.1117/12.194834

KEYWORDS: Mirrors, Prisms, Head, Distortion, Interferometers, In situ metrology, Fourier transforms, Profilometers, Laser beam diagnostics, Beam splitters

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Proceedings Article | 15 February 1994 Paper

Measurement of circular polarization close to the carbon K-edge using a transmission multilayer

Franz Schaefers, Helmuth Petersen, Andreas Gaupp, S. DiFonzo, Werner Jark, James Underwood

Proceedings Volume 2010, (1994) https://doi.org/10.1117/12.168590

KEYWORDS: Carbon, Polarization, Phase shifting, Phase shifts, X-rays, Polarimetry, Optical components, X-ray optics, Reflectivity, Silicon

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Showing 5 of 21 publications

Conference Committee Involvement (16)

Advances in X-Ray/EUV Optics and Components XVI

2 August 2021 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components XV

26 August 2020 | Online Only, California, United States

Advances in X-Ray/EUV Optics and Components XIV

14 August 2019 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components XIII

20 August 2018 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components XII

8 August 2017 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components XI

31 August 2016 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components X

11 August 2015 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components IX

19 August 2014 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components VIII

26 August 2013 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components VII

13 August 2012 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components VI

22 August 2011 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components V

2 August 2010 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components IV

3 August 2009 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components III

11 August 2008 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components II

27 August 2007 | San Diego, California, United States

Advances in X-Ray/EUV Optics, Components, and Applications

14 August 2006 | San Diego, California, United States

Showing 5 of 16 Conference Committees

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