Mr. Wesley R. Erck Profile

Wesley R. Erck

President at Wes Erck & Associates

SPIE Involvement:

Author

Area of Expertise:

Photomask design , SEMI P10 , Photomask ordering

Publications (2)

Proceedings Article | 11 May 2009 Paper

Economics of automation for the design-to-mask interface

Wesley Erck

Proceedings Volume 7379, 73790U (2009) https://doi.org/10.1117/12.824271

KEYWORDS: Photomasks, Semiconducting wafers, Manufacturing, Yield improvement, Prototyping, Computing systems, Software development, Error analysis, Instrument modeling, Product engineering

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Proceedings Article | 17 December 2003 Paper

Integrating design data with manufacturing data: why you want to use a universal data model (UDM)

Wesley Erck

Proceedings Volume 5256, (2003) https://doi.org/10.1117/12.518277

KEYWORDS: Photomasks, Data modeling, Semiconducting wafers, Manufacturing, Databases, Instrument modeling, Design for manufacturability, Image processing, Inspection, Performance modeling

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