Dr. X. Yan Profile

Dr. X. Yan

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Publications (1)

Proceedings Article | 20 May 2022 Presentation + Paper

Single-shot wavelength meter on a photonic chip for absolute distance measurement using frequency scanning interferometry

C. Coggrave, P. Ruiz, C. Pallikarakis, J. Huntley, H. Du, M. Banakar, X. Yan, D. Tran, C. Littlejohns

Proceedings Volume 12137, 1213703 (2022) https://doi.org/10.1117/12.2626785

KEYWORDS: Waveguides, Solid state electronics, Interferometry, Manufacturing, Distance measurement, Calibration, Short wave infrared radiation, Silicon photonics, Refractive index, Wavelength tuning

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