Mr. Yan Qu Profile

Yan Qu

at Changchun Univ of Science and Technology

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Proceedings Article | 5 November 2020 Paper

Investigation of size-of-source effect of Fourier-transform infrared radiation measurement facility with infrared optical system using direct method

Xu-yao Song, Wei Dong, Zun-dong Yuan, Zhi-bin Li, Xiao-feng Lu, Yan Qu

Proceedings Volume 11566, 115660G (2020) https://doi.org/10.1117/12.2579443

KEYWORDS: FT-IR spectroscopy, Black bodies, Infrared radiation, Radiation effects, Infrared imaging, Direct methods, Temperature metrology, Infrared spectroscopy, Spectroscopy

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Low size-of-source effect (SSE) infrared optical system design and experimental validation are critically involved. SSE is commonly explored in infrared radiation measurements. The main causes of SSE are the diffraction of the field aperture, the reflection of optical components and objective aberrations. The optical path design and the internal components scattering have an important influence on SSE. Reflective optical system is commonly used in infrared radiation measurements with high temperature region and wide wavelength range, which can eliminate chromatic aberration and reduce coma. A reflective infrared optical system is designed and built based on the high-temperature Fourier transform infrared (FTIR) spectrometer infrared radiation measurement facility at NIM. The ambient scattered radiation and the thermal effect of optical components are controlled via the water-cooled scattered radiation shielding bin and limitation apertures. Experimental validation of the SSE characteristics of the FTIR infrared optical system is carried out via the uniform blackbody radiation source at 500 °C and various sized apertures using the direct measurement method. The corresponding calculation model will be described in the paper. SSE on 3.9 μm is measured via the direct measurement method by using a standard reference blackbody with good temperature uniformity as the radiation source. The effect of reflection is reduced via the high emissivity coating on the apertures. The results show that the effect of the SSE on the FTIR measurement facility at the wavelength of 3.9 μm is less than 2×10^-4. Details and results of the infrared optical system SSE measurement will be reported in the paper. All measurements can be traceable to the National Standards of P. R. China.

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