Yanyi Leng
at Tianjin Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 April 2018 Paper
Proceedings Volume 10615, 106150K (2018) https://doi.org/10.1117/12.2303601
KEYWORDS: Image segmentation, Convolution, Neural networks, Image processing, Defect detection, Image classification, Classification systems, Inspection, Feature extraction, Optical inspection

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