Yohei Otsuka
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 10 April 2024 Poster + Paper
Proceedings Volume 12955, 1295534 (2024) https://doi.org/10.1117/12.3010733
KEYWORDS: Scanning electron microscopy, Electron beams, Feedback control, Signal detection, Semiconductors, Metrology, Scanning

Proceedings Article | 10 April 2024 Poster + Paper
Proceedings Volume 12955, 1295533 (2024) https://doi.org/10.1117/12.3010730
KEYWORDS: Electron beams, Semiconductors, Scanning electron microscopy, Transmission electron microscopy, Laser irradiation, Semiconductor materials, Group III-V semiconductors, Electron microscopes, Vacuum

Proceedings Article | 27 April 2023 Poster + Paper
Proceedings Volume 12496, 1249629 (2023) https://doi.org/10.1117/12.2657032
KEYWORDS: Electron beams, Quantum efficiency, Scanning electron microscopy, Indium gallium nitride, Semiconductors

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top