Annular sub-apertures stitching technology is a feasible method for testing asphere without assistant equipment. The
overlap area of two annular sub-apertures is needed to sample in traditional stitching way. The size of overlap area
influences the accuracy and efficiency of annular sub-apertures stitching, since small area will deduce the error of
calculation, otherwise, more sub-apertures will be needed. Based on the principle of annular sub-apertures interference, a
model is built to calculate the parameters of sub-apertures according to equal thickness interference in this paper firstly;
then two clear-cut interference areas near the center of asphere and annular sub-apertures are figured out by theory and
simulation. A new method is presented to use interference area near the center of asphere as the overlap area to sample.
The results of simulation in the paper reveal that this new method can reduce stitching error relatively and improve
efficiency availably, solving the inconsistency of error and efficiency consequently.
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