Detecting dielectric properties of objects imaged on persons in millimeter-wave AIT systems

James C. Weatherall; Kevin Yam; Peter R. Smith; Elia Lichtenstein; Barry T. Smith; Jeffrey Barber; Duane Karns

doi:10.1117/12.2560288

23 April 2020 Detecting dielectric properties of objects imaged on persons in millimeter-wave AIT systems

James C. Weatherall, Kevin Yam, Peter R. Smith, Elia Lichtenstein, Barry T. Smith, Jeffrey Barber, Duane Karns

Proceedings Volume 11411, Passive and Active Millimeter-Wave Imaging XXIII; 1141108 (2020) https://doi.org/10.1117/12.2560288
Event: SPIE Defense + Commercial Sensing, 2020, Online Only

Abstract

Advanced Imaging Technology (AIT) uses millimeter-waves for airport passenger screening. The Identification of Explosives (IDX) technique addresses secondary screening of detected anomalies by analyzing the reflectivity data across the frequency band of the imaging system to probe the electrical permittivity of the potential threat. To be practical, IDX must apply to targets that are not configured for free-space metrology, but have poorly defined surfaces and are imaged with non-ideal boundaries. In particular, the magnitude of the reflection coefficient, which is key to free-space measurement, cannot be obtained with any confidence. The detection is accomplished from frequency-dependent features in the interference spectrum, which provide material identifying information in the form of the dielectric loss tangent.

Conference Presentation

Citation Download Citation

James C. Weatherall, Kevin Yam, Peter R. Smith, Elia Lichtenstein, Barry T. Smith, Jeffrey Barber, and Duane Karns "Detecting dielectric properties of objects imaged on persons in millimeter-wave AIT systems", Proc. SPIE 11411, Passive and Active Millimeter-Wave Imaging XXIII, 1141108 (23 April 2020); https://doi.org/10.1117/12.2560288

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