CONFERENCE PROCEEDINGS
Advanced Search
Home > Proceedings > Volume 8729 > Article
Open Access Paper
29 May 2013 Using the Hitachi TM 3000 in a middle school classroom
Mary Ellen Wolfinger
Author Affiliations +
Proceedings Volume 8729, Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences; 87290D (2013) https://doi.org/10.1117/12.2016185
Event: SPIE Defense, Security, and Sensing, 2013, Baltimore, Maryland, United States
Abstract
In this presentation, Mary Ellen Wolfinger explains how the Hitachi TM 3000 scanning electron microscope was used in her sixth grade science classroom to incorporate science, technology, engineering and mathematics (STEM) education.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation Download Citation
Mary Ellen Wolfinger "Using the Hitachi TM 3000 in a middle school classroom", Proc. SPIE 8729, Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, 87290D (29 May 2013); https://doi.org/10.1117/12.2016185
PROCEEDINGS
 4 PAGES
DOWNLOAD PAPER SAVE TO MY LIBRARY
GET CITATION
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Scanning electron microscopy
Scanning transmission electron microscopy
Electron microscopes
Mathematics
Nanotechnology
Microscopes
Microscopy
RELATED CONTENT
Subscribe to Digital Library
Receive Erratum Email Alert
Back to Top