Real-time measurement of electrical and optical transients of as-deposited amorphous AgInSbTe thin films during crystallization induced by single-shot picosecond laser pulses

G. F. Liang; S. M. Li; H. Huang; F. X. Zhai; Y. Wang; T. S. Lai; Y. Q. Wu

doi:10.1117/12.2014860

24 January 2013 Real-time measurement of electrical and optical transients of as-deposited amorphous AgInSbTe thin films during crystallization induced by single-shot picosecond laser pulses

G. F. Liang, S. M. Li, H. Huang, F. X. Zhai, Y. Wang, T. S. Lai, Y. Q. Wu

Author Affiliations +

Proceedings Volume 8782, 2012 International Workshop on Information Storage and Ninth International Symposium on Optical Storage; 87820M (2013) https://doi.org/10.1117/12.2014860
Event: 2012 International Workshop on Information Data Storage and Ninth International Symposium on Optical Storage, 2012, Shanghai, China

Abstract

The crystallization properties of as-deposited amorphous AgInSbTe thin films irradiated by single-shot picosecond laser pulses were studied using in-situ transient optical reflectance and electrical resistance measurements with nanosecond resolution. It was found that the real-time optical and electrical signal responses were different under the same pumping conditions. The optical signals showed a multistage crystallization process with a total time of approximately 150 ns, while the electrical signals showed a negative exponential trend decreasing to the final stable state within about several microseconds. A resistor–capacitor model was constructed to explain this delayed electrical response. The fluencedependent evolution dynamics maybe implied a non-fully crystallization process under ultra-short pulse stimulation.

Citation Download Citation

G. F. Liang, S. M. Li, H. Huang, F. X. Zhai, Y. Wang, T. S. Lai, and Y. Q. Wu "Real-time measurement of electrical and optical transients of as-deposited amorphous AgInSbTe thin films during crystallization induced by single-shot picosecond laser pulses", Proc. SPIE 8782, 2012 International Workshop on Information Storage and Ninth International Symposium on Optical Storage, 87820M (24 January 2013); https://doi.org/10.1117/12.2014860

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
8 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Crystals

Reflectivity

Silver indium antimony tellurium

Picosecond phenomena

Laser crystals

Resistance

Thin films

Show All Keywords

Keywords/Phrases

Search In:

Publication Years