ALTA 4700DP, a new design laser mask pattern generator (LMPGs), is constructed with multi-core CPU server. Different from the traditional hardware-based data path LMPGs, the integrated software features of ALTA 4700DP provide the compensation function for critical dimension (CD) variation which caused from the post-exposure processing of the plate. The process includes the post-exposure bake, the developing of the photoresist, and the etching of the chrome. Through the correction of the density-dependent errors and process-footprint errors, the global CD uniformity can be improved.
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