In order to meet the requirement of frequent in-situ calibration before micro-thrust measurement, a new calibration method based on laser interference is proposed. Based on common optical elements, the interference light path is set up, and the light path adjustment process is simplified by using the visible light of 532nm wavelength as the light source. The calibration principle is that the capacitive displacement sensor and laser interferometer simultaneously measure the movable pyramid prism’s position change resulted by adjusting displacement table, and the measurement result of laser interferometer is viewed as the reference displacement to carry on the sensor's calibration. By comparing with the sensor output, the method of calculating the number of fringes corresponding to optical path difference is analyzed. The practicability and accuracy of the calibration device is verified by experiment, and the calibration results and the relative error are analyzed at last.
With continuous improvements of semiconductor laser performance and semiconductor laser technology, diode laser has been adopted in many applications in research and industrial areas, such as optical frequency standard, fiber communication, laser ranging, high resolution spectroscopy, laser cooling and trapping atoms, etc. Frequency stability and line width are the most important parameters concerned in special applications. In this paper, based on saturated absorption spectroscopy, we introduce the frequency stabilization of diode laser by metastable Kr atom. For its narrow natural line width, Kr transition can be used as a perfect frequency reference for laser frequency stabilization, and the reproducibility can also easily be achieved because of the intrinsic physical property. The laser frequency can also be shifted by an acoustic-optical modulator by precisely adjusting its driving frequency. This is important as one tries to manipulate different isotopes via the same laser. Methods of measuring frequency stability and line-width are also discussed at last.
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