Dr. G. Ali Rezvani Profile

Dr. G. Ali Rezvani

Device Engineering Manager at RFMD

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Publications (1)

Proceedings Article | 1 September 1999 Paper

Estimation of quantum mechanical and polysilicon depletion effects for ultrathin silicon dioxide gate dielectric

G. Srinivasan, Samar Saha, G. Rezvani

Proceedings Volume 3881, (1999) https://doi.org/10.1117/12.360549

KEYWORDS: Oxides, Data modeling, Silicon, Dielectrics, Field effect transistors, Quantization, CMOS technology, Computer simulations, Instrument modeling, Silica

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