Mr. Jiapeng Wang Profile

Jiapeng Wang

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Proceedings Article | 29 December 2023 Paper

Night vision measuring instrument

Zexuan Li, Jiapeng Wang, Shangzhong Jin, Chunlian Zhan, Kexuan Wu

Proceedings Volume 12976, 129761K (2023) https://doi.org/10.1117/12.3009409

KEYWORDS: Night vision, Equipment, Design, Night vision systems, Optical design, Standards development, Integrating spheres, Image resolution

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In night vision technology, due to the passive technology's unidirectional and high concealment advantages, it has been paid attention to, among which the low light level night vision instrument has obtained rapid development. With the improvement of the performance of low light level night vision instrument, it is very important to test the index of high resolution and wide field of view to ensure the comprehensive performance of night vision instrument. In China, in the development of low-light night vision instrument, many standard equipment in the laboratory are used to piece together, or the equipment developed is a general low-light test equipment, and a special and standard low-light night vision instrument tester has not been developed. In this study, a comprehensive measurement method of night vision is proposed. Through the design of resolution, contrast test module, field of view Angle test module and data acquisition system, a complete and multi-functional test system is formed, in which the system aperture is greater than 110mm, the resolution test range is 0.06~2.6mrad, and the field of view Angle measurement range is ±25°. The light source brightness ranges from 1.6×10^-5 to 5×10^-3 cd/cm². Through the docking verification with the night vision instrument, the low light level night vision instrument tester has realized the accurate measurement of the low light level night vision instrument's resolution, field Angle, contrast and other indicators, which provides a guarantee for the performance of the low light level night vision instrument.

Proceedings Article | 29 December 2023 Paper

Research on on-orbit calibration source technology for space infrared load

Ziwei Xu, Xin Zhang, Jiapeng Wang, Wanglin Yang

Proceedings Volume 12976, 129761G (2023) https://doi.org/10.1117/12.3009251

KEYWORDS: Calibration, Temperature metrology, Infrared radiation, Infrared technology, Vacuum chambers, Black bodies, Infrared detectors, Platinum, Emissivity, Vacuum

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In recent years, with the development of infrared technology, the radiation value of targets can be quantitatively detected through radiation parameter calibration, making it possible for infrared payloads to determine the type of target based on the radiation value, greatly improving the detection ability of infrared payloads. To ensure the quantitative detection accuracy, it is necessary to calibrate the radiation parameters of the infrared load, accurately grasp the inversion coefficient of the infrared load, and ensure the inversion accuracy of the detection data. This article focuses on the urgent need for on orbit radiation calibration of infrared payloads, and conducts research on on orbit calibration sources based on memes technology. Through experimental verification, the on orbit calibration source, as the standard source for on orbit calibration of loads, can provide a stable infrared radiation and has the characteristics of wide temperature range and multiple calibration points, meeting the calibration requirements during the operation of infrared loads. The on orbit calibration source can serve as a spatial quantity reference to provide high quantitative calibration for infrared remote sensing payloads, laying a solid technical foundation for the next step of space infrared payloads and future development of China's infrared satellites.

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