Michael Tamme
Global Product Specialist Photomask Equipment at HamaTech APE GmbH & Co KG
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 September 1995 Paper
Peter Paduschek, Michael Tamme, Thomas Hankey
Proceedings Volume 2638, (1995) https://doi.org/10.1117/12.221193
KEYWORDS: Ellipsometry, Multilayers, Thin films, Refractive index, Interferometers, Oxides, Optical parametric oscillators, Semiconductors, Interferometry, Absorption

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top