Norshakirah Ab.Aziz
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 13 January 2012 Paper
Norshakirah Ab.Aziz, Rohiza Ahmad, Dominic Dhanapal Durai
Proceedings Volume 8350, 835031 (2012) https://doi.org/10.1117/12.920549
KEYWORDS: Reliability, Information technology, Manufacturing, Printed circuit board testing, Internet technology, Machine vision, Analytical research, Prototyping, Statistical analysis

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