Dr. Guru Prasad A. S.
Advanced Technologist at Nanyang Technological Univ
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 13 June 2017 Paper
P. Prabhathan, Chaolong Song, Aswin Haridas, Guru Prasad, Kelvin Chan, Murukeshan V. M.
Proceedings Volume 10449, 1044913 (2017) https://doi.org/10.1117/12.2270539
KEYWORDS: Speckle, Surface roughness, Optical metrology, Laser optics, Laser metrology, Machine vision, Speckle pattern, Error analysis, Calibration, Optical resolution

Proceedings Article | 13 June 2017 Paper
P. Prabhathan, Chaolong Song, Aswin Haridas, Guru Prasad, Kelvin Chan
Proceedings Volume 10449, 1044912 (2017) https://doi.org/10.1117/12.2270535
KEYWORDS: Surface roughness, Optical metrology, Laser metrology, Speckle, Image processing, Metrology, Manufacturing, Surface finishing, Nondestructive evaluation, Optics manufacturing

Proceedings Article | 13 June 2017 Paper
Proceedings Volume 10449, 104492W (2017) https://doi.org/10.1117/12.2270900
KEYWORDS: Surface roughness, Speckle, Additive manufacturing, Radium, Nondestructive evaluation, Speckle metrology, Speckle pattern, Statistical analysis, Calibration, Inspection

Proceedings Article | 11 November 2016 Paper
Proceedings Volume 10150, 1015008 (2016) https://doi.org/10.1117/12.2243778
KEYWORDS: Imaging systems, GRIN lenses, Metrology, Lenses, Speckle metrology, Objectives, Speckle imaging, Distortion, Modulation transfer functions, Speckle

Proceedings Article | 17 July 2015 Paper
Proceedings Volume 9524, 95242Q (2015) https://doi.org/10.1117/12.2190498
KEYWORDS: Speckle, Inspection, Surface roughness, Image processing, Speckle pattern, Metrology, Speckle imaging, Feature extraction, Nondestructive evaluation, Optical engineering

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