Dr. Patinharekandy Prabhathan Profile

Dr. Patinharekandy Prabhathan

SPIE Involvement:

Author

Publications (11)

Proceedings Article | 13 June 2017 Paper

Experimental investigations and parametric studies of surface roughness measurements using spectrally correlated speckle images

P. Prabhathan, Chaolong Song, Aswin Haridas, Guru Prasad, Kelvin Chan, Murukeshan V. M.

Proceedings Volume 10449, 1044913 (2017) https://doi.org/10.1117/12.2270539

KEYWORDS: Speckle, Surface roughness, Optical metrology, Laser optics, Laser metrology, Machine vision, Speckle pattern, Error analysis, Calibration, Optical resolution

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Proceedings Article | 13 June 2017 Paper

Surface roughness measurement of additive manufactured samples using angular speckle correlation

Kapil Dev, Guru Prasad A. S., Aswin H, Prabhathan P, Kelvin H. K. Chan, Murukeshan Matham

Proceedings Volume 10449, 104492W (2017) https://doi.org/10.1117/12.2270900

KEYWORDS: Surface roughness, Speckle, Additive manufacturing, Radium, Nondestructive evaluation, Speckle metrology, Speckle pattern, Statistical analysis, Calibration, Inspection

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Proceedings Article | 13 June 2017 Paper

Fractal speckle image analysis for surface characterization of aerospace structures

Aswin Haridas, Alexandru Crivoi, P. Prabhathan, Kelvin Chan, V. M. Murukeshan

Proceedings Volume 10449, 104491T (2017) https://doi.org/10.1117/12.2270769

KEYWORDS: Inspection, Aerospace engineering, Metrology, Optical metrology, Laser metrology, Optical design, Optical fabrication

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Proceedings Article | 13 June 2017 Paper

A fractal image analysis methodology for heat damage inspection in carbon fiber reinforced composites

Aswin Haridas, Alexandru Crivoi, P. Prabhathan, Kelvin Chan, V. M. Murukeshan

Proceedings Volume 10449, 104491L (2017) https://doi.org/10.1117/12.2270727

KEYWORDS: Composites, Fractal analysis, Image analysis, Inspection, Carbon, Glasses, Nondestructive evaluation, Fiber reinforced polymers, Aerospace engineering, Aircraft structures

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Proceedings Article | 13 June 2017 Paper

Intensity and contrast based surface roughness measurement approaches for rough and shiny surfaces

P. Prabhathan, Chaolong Song, Aswin Haridas, Guru Prasad, Kelvin Chan

Proceedings Volume 10449, 1044912 (2017) https://doi.org/10.1117/12.2270535

KEYWORDS: Surface roughness, Optical metrology, Laser metrology, Speckle, Image processing, Metrology, Manufacturing, Surface finishing, Nondestructive evaluation, Optics manufacturing

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Proceedings Article | 11 November 2016 Paper

Design and simulation of GRIN objective lenses for an imaging fiber based speckle metrology system

P. Prabhathan, A. S. Guru Prasad, Aswin Haridas, Kelvin H. Chan, V. M. Murukeshan

Proceedings Volume 10150, 1015008 (2016) https://doi.org/10.1117/12.2243778

KEYWORDS: Imaging systems, GRIN lenses, Metrology, Lenses, Speckle metrology, Objectives, Speckle imaging, Distortion, Modulation transfer functions, Speckle

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SPIE Journal Paper | 23 September 2015

Dielectric supported bimetal layer configuration for long-range surface plasmon polariton interference–based subwavelength lithography

Patinharekandy Prabhathan, Vadakke Matham Murukeshan

OE, Vol. 54, Issue 09, 097107, (September 2015) https://doi.org/10.1117/12.10.1117/1.OE.54.9.097107

KEYWORDS: Dielectrics, Metals, Lithography, Surface plasmon polaritons, Interfaces, Surface plasmons, Nanolithography, Prisms, Silver, Refractive index

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Proceedings Article | 8 October 2014 Paper

Near-field assisted nanoscale patterning for improved absorption in thin film silicon solar cell

V. Murukeshan, P. Prabhathan, R. Sidharthan

Proceedings Volume 9180, 91800A (2014) https://doi.org/10.1117/12.2069667

KEYWORDS: Thin film solar cells, Near field optics, Optical lithography, Absorption, Near field, Metals, Thin films, Silicon solar cells, Surface plasmons, Solar energy

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SPIE Journal Paper | 16 April 2012

Optimal detuning combinations in a series coupled silicon micro ring resonator thermo optic-wavelength selective switch

Patinharekandy Prabhathan, Vadakke Murukeshan, Jing Zhang

OE, Vol. 51, Issue 4, 044604, (April 2012) https://doi.org/10.1117/12.10.1117/1.OE.51.4.044604

KEYWORDS: Resonators, Switching, Waveguides, Silicon, Switches, Refractive index, Thermography, Thermal optics, Optical engineering, Reactive ion etching

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Proceedings Article | 16 November 2010 Paper

Compact resonant Bragg-grating filters using submicron silicon-on-insulator(SOI) waveguide for optical communication network

P. Prabhathan, V. Murukeshan, Zhang Jing

Proceedings Volume 7847, 78470H (2010) https://doi.org/10.1117/12.869644

KEYWORDS: Phase shifts, Optical filters, Waveguides, Silicon, Reactive ion etching, Optical communications, Electronic filtering, Electron beam lithography, Mirrors, Optical networks

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Proceedings Article | 8 February 2008 Paper

Taper couplers for coupling between laser and silicon waveguide with large allowable tolerance

Jing Zhang, Bihan Li, Jayakrishnan Chandrappan, Qing Xin Zhang, Pamidighantam Ramana, Patinharekandy Prabhathan, Hon Shing Lau, Dim Lee Kwong, Murukeshan Vadakke Matham

Proceedings Volume 6899, 689909 (2008) https://doi.org/10.1117/12.764254

KEYWORDS: Semiconductor lasers, Waveguides, Silicon, Tolerancing, Waveguide lasers, Light wave propagation, Packaging, Optical benches, Photonics, Assembly tolerances

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Showing 5 of 11 publications

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