This study demonstrates the possibility of using the SERS method to detect methotrexate (MTX) molecules in the blood plasma of patients in concentrations up to 10-6 M. The paper performs investigation for samples from patients who took the drug at different doses. Borosilicate glasses coated with silver nanoparticles were used as the surface. We analyzed the differences between the spectra of patients after taking medication and healthy volunteers without taking medication. The characteristic maxima of methotrexate were determined.
The effect of the thickness of the polyvinyl alcohol film on the position of the plasmon maximum at the modified titanium-dielectric interface was investigated. The integration of bismuth oxide, thulium oxide, as well as their mixtures into thin polymer films (thickness of up to 1.3 μm) was carried out. It was established that the spectral shift of the plasmon maximum into the red region of the spectrum is due to the roughness features of the titanium surface as a result of anodizing and due to the thickness of the PVA film. The presence of the overlap in the reflection spectra of thulium oxide and bismuth oxide has been established, which leads to a complete leveling of the spectral band of thulium oxide in the region of 350 nm.
This work presents the process of creating laser-induced surface structures by fs laser radiation with circular polarization and the study of their optical properties by ellipsometry method. This report presents SEM images of the Cu and Cu/Au surfaces and the studies of spectral features of dielectric permittivity function and reflection coefficients of s- and p-polarized light.
In this paper, the plasmon resonance splitting on the anodized modified titanium has been studied. The plasmons absorption process in the permittivity functions spectra and reflectance spectra of p- and s-polarized light on the titanium oxide surface have been analyzed when the surface roughness parameters are changing. The surface roughness values were also estimated in this paper. Spectral features of the negative refractive index in the area of surface plasmon generation on the rough titanium-oxide film interface have been also presented in this paper. Surface roughness parameters are also determined. The upconversion luminescence enhancement of the ytterbium oxide on the rough titanium surface was observed in this work.
The study of the applicability of a nano-polycrystalline diamond (NPD) as a lens material is presented. Two NPD plates with a diameter of 8 mm and a thickness of 0.1 and 1 mm were manufactured using the HPHT process. Coherence preservation properties of the NPD samples were checked using in-line phase-contrast imaging. Wide-Angle X-ray Scattering and Small Angle X-ray Scattering experiments were performed to examine the NPD scattering properties. Rotationally parabolic half-lens from a 100 μm thick NPD plate was manufactured using the maskless direct milling using a Zeiss CrossBeam 540 FIB-SEM system.
This paper presents the process of creating a gold surface modified by periodic structures deposited by femtosecond laser radiation by two different geometry. The refraction processes of s- and p-polarized light on the gold structured surfaces with the changes in the dielectric permittivity function were studied and compared in this paper. The presence of surface plasmon generation on the rough gold surface in visible region at two frequencies has been established in this work.
We are proposing an X-ray reflecto-interferometry technique using an x-ray microfocus laboratory source for thin-film structure research based on compound refractive lenses. The idea of this technique is to use a very simplified experimental setup where a focused X-ray beam reflected from parallel flat surfaces creates an interference pattern in a wide angular range. Due to this, the interference pattern can be obtained in a single shot without the need to rotate the specimen or the detector. The applicability of this technique has been demonstrated using the MetalJet Excillium microfocus laboratory source, which has GaKα emission line at 9.25 keV. A series of interference patterns for Si3N4 membranes and the experimentally obtained film thickness are in good agreement with the declared characteristics. The main advantages and future possible of the reflecto-interferometry technique are discussed.
We demonstrate the capabilities of ion-beam lithography (IBL) for the manufacturing of X-ray micro-optics from amorphous materials. The feasibility of rapid and direct milling of microlenses in glass using a Ga+ ion beam is presented in this work. A single lens with curvature radii below 3 μm was produced from microstructure- and artifacts-free materials: borosilicate glass. In addition, the use of IBL to create optics with a complex curved surface with a radius of curvature of less than 3 μm from single crystal silicon has been shown. The new generation of micro-optics from new materials will be in demand for coherent applications at modern diffraction-limited light sources.
We demonstrate the capabilities of ion-beam lithography (IBL) for the manufacturing of the X-ray refractive micro-optics. For the first time with the help of IBL, the hardest of current materials – diamond – was milled, and microscale diamond half-lenses were produced. Lenses have a rotationally parabolic profile with radii of parabola apexes in the range from 3 to 10 μm. As has been confirmed with SEM, the surface of produced lenses was free of low- and high-frequency modulations: figure errors of fabricated lenses were < 200 nm, while the surface roughness was estimated to be 30 nm. The optical performance of the lens was successfully tested at a third-generation synchrotron, where the lenses provided diffraction-limited focusing of X-ray radiation and demonstrated intensity profiles with Gaussian distributions at every measured longitudinal position (along the optical axis) downstream of the optics.
A new X-ray Reflecto-Interferometry (XRI) technique is proposed and realized for thin-film characterization. The XRI employs refractive optics that produce a converging fan of radiation, incident onto a sample surface, and a high-resolution CCD detector, which simultaneously collects the reflecto-interferogram over a wide angular range. The functional capabilities of the new method were experimentally tested at the ESRF ID06, and ID10 beamlines in the X-ray energy range from 14 keV to 22 keV. The free-standing Si3N4 membranes with different thickness were studied. The main advantages and possible future applications of the proposed reflecto-interferometry are discussed.
X-ray reflecto-interferometry technique based on compound refractive lenses using an x-ray laboratory source was proposed to study thin-film structures. The setup for this experiment is very simple: a focused x-ray beam is reflected from parallel flat surfaces, which creates an interference pattern in a wide angular range, therefore the interference pattern can be obtained in a single shot without the need to rotate the sample or the detector. The reflecto-interferograms for Si3N4 membranes were obtained using the MetalJet Excillium micro-focus laboratory source with GaKα emission line at 9.25 keV. The experimentally obtained film thickness is in good agreement with the declared characteristics.
Optical properties (reflection, refractive index, real and imaginary part of permittivity function) of rough titanium surfaces fabricated by anodizing method at different anodic voltage have been studied. It is shown that a negative region in the visible wavelength range is observed on a rough titanium surface in the refractive index spectrum; its minimum appeared to be red-shifted shifted with surface roughness increase. These optical-nonlinear effects are studied by means s- and p-polarized light reflection coefficients spectra and permittivity spectra registration. It is also shown that the generation of surface plasmon oscillations in the visible spectral region on the rough titanium surface is possible. Excitation of surface plasmons is found to be accompanied by redistribution of the incident electromagnetic energy on the surface and leads to various nonlinear effects including negative values of the refractive index.
X-ray microscopy is advantageous over conventional optical microscopy because of its high resolution and capability to study the inner structure of materials opaque to visible light. Furthermore, this method does not require metallization and vacuum and therefore it can be used to visualize fragile biological samples that cannot be studied by scanning electron microscopy. Focusing X-ray optics may be roughly divided into three groups based on the physical principle of focusing: reflection, diffraction and refraction. The reflection optics includes curved mirrors, multilayers and capillaries; the diffractive optics includes Fresnel zone plates. Refractive optics comprises X-ray compound refractive lenses (CRLs) that are widely used nowadays because of their compactness and ease of fabrication. Focusing performance of the CRL is determined by the refractive index, absorption, the inner structure of the CRL material and the geometry of the lens. The optimal shape for the lens is parabolic with a small radius of curvature, because the smaller radius of the parabola leads to shorter focal distance and therefore allows to achieve higher resolution. The common choice of the CRL material is beryllium. However the resolution of Be lenses is far below theoretically predicted limits because of the parasitic scattering introduced by the grains in the material. Moreover the existing manufacturing technologies do not allow to achieve radius of curvature less than 50 μm. Polymer materials are also popular for the CRL microfabrication because of their amorphous nature, ease of structuring and low price. Among the advanced lithographic techniques the two-photon polymerization lithography (2PP) holds a special place. It is based on polymer solidification by means of two-photon absorption. Nonlinear character of two-photon absorption leads to the transparency of the out-of focus material, while presence of polymerization threshold reduces resolution far below diffraction limit. Therefore 2PP can be used for fabrication 3D structures of almost arbitrary shape including overhanging and self-intersecting structures.
In this work we introduce the 3D X-ray CRL fabricated by 2PP from the commercially available photoresist ORMOCOMP. Hundred double concave individual lenses formed a CRL with the 60 μm distance between adjacent lenses. Radius of curvature of a single parabolic surface was 3 μm that is comparable to radius of 2D silicon nano-lens made by conventional lithography and much less than achievable radius of 3D Be lens. Physical aperture was 28 μm. The optimal processing parameters (power, incident on the sample, and velocity of the laser beam waist movement) were determined. The fabricated CRL was studied by scanning electron microscopy. It was shown that surface of the lens is smooth and the geometrical parameters do not deviate significantly from that of the model.
Focusing performance of lenses was studied by the knife-edge technique. It was obtained that the focal distance is not larger than 2 cm at the energy of 9.25 keV. The radiation resistance of the CRL was tested at the synchrotron DESY: PETRA-III. The CRL was exposed at the non-focused X-ray radiation with the standard power and the energy of 12 keV for more than 10 hours without visible degradation.
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