Mu-Jing Li
CAD Engineer at Sun MicroSystems Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 July 2003 Paper
Mu-Jing Li, Suryanarayana Maturi, Pankaj Dixit
Proceedings Volume 5042, (2003) https://doi.org/10.1117/12.504322
KEYWORDS: Metals, Computer aided design, Reliability, Yield improvement, Astatine, Lithium, Sun, Microsystems, Copper, Microelectronics

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