Dr. Roland Höfling Profile

Dr. Roland Höfling

Deceased at ViALUX GmbH

SPIE Involvement:

Author

Publications (21)

Proceedings Article | 4 March 2019 Presentation + Paper

Generating high-precision grayscale line profiles using DLP at maximum speed

Roland Höfling, Frank Leischnig, Sören Gärtner, Petra Aswendt

Proceedings Volume 10932, 109320H (2019) https://doi.org/10.1117/12.2506881

KEYWORDS: Industrial metrology, Digital Light Processing, Sensors, Phase shifting, Inspection, 3D metrology, Structured light

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Proceedings Article | 10 March 2015 Paper

Characteristics of digital micromirror projection for 3D shape measurement at extreme speed

Roland Höfling, Petra Aswendt, Frank Leischnig, Matthias Förster

Proceedings Volume 9376, 937608 (2015) https://doi.org/10.1117/12.2082525

KEYWORDS: 3D metrology, Digital Light Processing, Photodiodes, Micromirrors, Mirrors, Switching, Oscilloscopes, Phase shifting, Projection systems, Digital micromirror devices

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Proceedings Article | 14 February 2009 Paper

Real-time 3D shape recording by DLP-based all-digital surface encoding

Roland Höfling, Petra Aswendt

Proceedings Volume 7210, 72100E (2009) https://doi.org/10.1117/12.807573

KEYWORDS: 3D metrology, Receivers, Cameras, Mirrors, Computer programming, Analog electronics, Fringe analysis, 3D acquisition, Binary data, Projection systems

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Proceedings Article | 18 June 2007 Paper

External-cavity diode laser utilizing a micromirror device for spectral tuning

Michael Breede, Christoph Kasseck, Carsten Brenner, Nils Gerhardt, Roland Höfling, Martin Hofmann

Proceedings Volume 6616, 66160R (2007) https://doi.org/10.1117/12.726825

KEYWORDS: Mirrors, Optical coherence tomography, Semiconductor lasers, Micromirrors, Digital micromirror devices, Tunable lasers, Light sources, Modulation, Diffraction gratings, Laser resonators

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Proceedings Article | 18 June 2007 Paper

Properties of the DMD digital micromirror device for new emerging applications in optical engineering

Cheraina Dunn, Roland Höfling

Proceedings Volume 6616, 66160K (2007) https://doi.org/10.1117/12.726824

KEYWORDS: Digital micromirror devices, Mirrors, Digital Light Processing, Binary data, Projection systems, Microelectromechanical systems, Optical engineering, Switching, Spatial light modulators, Modulation

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Proceedings Article | 13 June 2005 Paper

Industrial inspection of specular surfaces using a new calibration procedure

Petra Aswendt, Roland Hofling, Soren Gartner

Proceedings Volume 5856, (2005) https://doi.org/10.1117/12.621587

KEYWORDS: Cameras, Sensors, Reflectivity, Calibration, Inspection, Phase measurement, Reflection, Glasses, Mirrors, Structured light

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Proceedings Article | 10 September 2004 Paper

All-digital phase code: a proposal for high-speed 3D-shape recording

Roland Hofling

Proceedings Volume 5457, (2004) https://doi.org/10.1117/12.547907

KEYWORDS: Digital micromirror devices, Cameras, Analog electronics, Fringe analysis, Sensors, Receivers, Micromirrors, Aluminium phosphide, Modulation, Digital Light Processing

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Proceedings Article | 28 May 2004 Paper

ALP: universal DMD controller for metrology and testing

Roland Hoefling, Enrico Ahl

Proceedings Volume 5289, (2004) https://doi.org/10.1117/12.528336

KEYWORDS: Digital micromirror devices, Aluminium phosphide, Interfaces, Cameras, Field programmable gate arrays, Metrology, Binary data, Micromirrors, Optical metrology, 3D metrology

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Proceedings Article | 3 May 2004 Paper

High-speed 3D imaging by DMD technology

Roland Hoefling

Proceedings Volume 5303, (2004) https://doi.org/10.1117/12.528341

KEYWORDS: Digital micromirror devices, Aluminium phosphide, Cameras, Machine vision, Image quality, Stereoscopy, Imaging systems, 3D metrology, Interfaces, Fringe analysis

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SPIE Journal Paper | 1 June 2001

Hologram reconstruction using a digital micromirror device

Thomas Kreis, Petra Aswendt, Roland Hoefling

OE, Vol. 40, Issue 06, (June 2001) https://doi.org/10.1117/12.10.1117/1.1367346

KEYWORDS: Digital micromirror devices, Holograms, Digital holography, Holographic interferometry, 3D image reconstruction, Micromirrors, Holography, Charge-coupled devices, Mirrors, Binary data

SPIE Journal Paper | 1 January 2000

Phase reflection: a new solution for the detection of shape defects on car body sheets

Roland Hoefling, Petra Aswendt, Reimund Neugebauer

OE, Vol. 39, Issue 01, (January 2000) https://doi.org/10.1117/12.10.1117/1.602349

KEYWORDS: Reflection, Scattering, Phase shifts, Phase measurement, Fringe analysis, Mirrors, Defect detection, Metals, Retroreflectors, Charge-coupled devices

Proceedings Article | 21 September 1999 Paper

Shape measurement in sheet metal formation: requirements and solutions

Roland Hoefling, Petra Aswendt, Reimund Neugebauer

Proceedings Volume 3824, (1999) https://doi.org/10.1117/12.364271

KEYWORDS: Metals, Digital micromirror devices, Charge-coupled devices, Optical testing, Time metrology, Switches, Algorithm development, Systems modeling, Phase shifts, CCD cameras

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Proceedings Article | 15 September 1999 Paper

Testing microcomponents by speckle interferometry

Petra Aswendt, Roland Hoefling, Karla Hiller

Proceedings Volume 3825, (1999) https://doi.org/10.1117/12.364298

KEYWORDS: Speckle, Multispectral imaging, Speckle interferometry, Interferometers, Speckle pattern, Interferometry, Sensors, Fringe analysis, Gyroscopes, Microelectromechanical systems

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Proceedings Article | 3 September 1999 Paper

Optical full-field technique for measuring deflection and strain on micromechanical components

Petra Aswendt, Roland Hoefling, Karla Hiller

Proceedings Volume 3875, (1999) https://doi.org/10.1117/12.360479

KEYWORDS: Speckle, Interferometry, Speckle pattern, Multispectral imaging, Microelectromechanical systems, Fringe analysis, Interferometers, Speckle interferometry, Sensors, Microscopes

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Proceedings Article | 29 September 1998 Paper

Experimental and numerical analysis of the thermal deformation of composite tubes

Daniel Holstein, Petra Aswendt, Roland Hoefling, Claus-Dieter Schmidt, Werner Jueptner

Proceedings Volume 3407, (1998) https://doi.org/10.1117/12.323351

KEYWORDS: Composites, 3D modeling, Interferometry, Holographic interferometry, Holography, Thermal modeling, Numerical analysis, Speckle interferometry, Finite element methods, Modeling

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Proceedings Article | 6 July 1998 Paper

Simulation and experiment on the thermal deformation of composite tubes

Daniel Holstein, Petra Aswendt, Roland Hoefling, Claus-Dieter Schmidt, Werner Jueptner

Proceedings Volume 3479, (1998) https://doi.org/10.1117/12.316457

KEYWORDS: Composites, 3D modeling, Holographic interferometry, Finite element methods, Interferometry, Holography, Modeling, Speckle interferometry, Optical simulations, Speckle pattern

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Proceedings Article | 18 August 1997 Paper

Application of a high-power diode laser for laser bending

Daniela Lopez Cutino, Joerg Dubslaff, Roland Hoefling, Petra Aswendt

Proceedings Volume 3097, (1997) https://doi.org/10.1117/12.281137

KEYWORDS: Semiconductor lasers, Metals, High power lasers, Laser systems engineering, Laser applications, Diodes, Laser processing, Continuous wave operation, Absorption, Image processing

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Proceedings Article | 18 September 1996 Paper

Steps towards the use of DSPI for high-temperature strain measurement

Petra Aswendt, Roland Hoefling

Proceedings Volume 2782, (1996) https://doi.org/10.1117/12.250740

KEYWORDS: Interferometry, Temperature metrology

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Proceedings Article | 18 September 1996 Paper

Interferometric study of a machine tool

Roland Hoefling, Jaroslav Vaclavik, Reimund Neigebauer

Proceedings Volume 2782, (1996) https://doi.org/10.1117/12.250768

KEYWORDS: Interferometry, Nondestructive evaluation, Speckle pattern, Head, Spindles

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Proceedings Article | 23 June 1995 Paper

Characterization of microvibrations by speckle interferometry

Roland Hoefling, Volkmar Liebig, Claus-Dieter Schmidt

Proceedings Volume 2545, (1995) https://doi.org/10.1117/12.212646

KEYWORDS: Interferometry, Finite element methods, Speckle pattern, Silicon, Fringe analysis, Speckle interferometry, Error analysis, Ultrasonics, Shape analysis, Nondestructive evaluation

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Proceedings Article | 1 October 1991 Paper

DSPI: a tool for analyzing thermal strain on ceramic and composite materials

Roland Hoefling, Petra Aswendt, Werner Totzauer, Werner Jueptner

Proceedings Volume 1508, (1991) https://doi.org/10.1117/12.47099

KEYWORDS: Composites, Fringe analysis, Ceramics, Holography, Speckle, Carbon, Thermal effects, Digital signal processing, Image processing, Solids

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Showing 5 of 21 publications

Proceedings Volume Editor (1)

SPIE Conference Volume | 3 October 2001

Optical Measurement Systems for Industrial Inspection II: Applications in Production Engineering

Conference Committee Involvement (16)

Emerging Digital Micromirror Device Based Systems and Applications XIV

25 January 2022 | San Francisco, California, United States

Emerging Digital Micromirror Device Based Systems and Applications XIII

6 March 2021 | Online Only, California, United States

Emerging Digital Micromirror Device Based Systems and Applications XII

4 February 2020 | San Francisco, California, United States

Emerging Digital Micromirror Device Based Systems and Applications XI

5 February 2019 | San Francisco, California, United States

Emerging Digital Micromirror Device Based Systems and Applications X

30 January 2018 | San Francisco, California, United States

Emerging Digital Micromirror Device Based Systems and Applications IX

31 January 2017 | San Francisco, California, United States

Emerging Digital Micromirror Device Based Systems and Applications VIII

15 February 2016 | San Francisco, California, United States

Emerging Digital Micromirror Device Based Systems and Applications VII

10 February 2015 | San Francisco, California, United States

Emerging Digital Micromirror Device Based Systems and Applications VI

4 February 2014 | San Francisco, California, United States

Emerging Digital Micromirror Device Based Systems and Applications IV

23 January 2012 | San Francisco, California, United States

Optical Measurement Systems for Industrial Inspection

23 May 2011 | Munich, Germany

Optical Measurement Systems for Industrial Inspection

16 June 2009 | Munich, Germany

Optical Measurement Systems for Industrial Inspection

18 June 2007 | Munich, Germany

Optical Measurement Systems for Industrial Inspection IV

13 June 2005 | Munich, Germany

Optical Measurement Systems for Industrial Inspection III

23 June 2003 | Munich, Germany

Optical Measurement Systems for Industrial Inspection II: Applications in Production Engineering

20 June 2001 | Munich, Germany

Showing 5 of 16 Conference Committees

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