Dr. Werner P. O. Jüptner
Retired
SPIE Involvement:
Track Chair | Author
Publications (106)

Proceedings Article | 27 May 2011 Paper
Thomas Kreis, Lars Rosenboom, Werner Jüptner
Proceedings Volume 8082, 808234 (2011) https://doi.org/10.1117/12.889112
KEYWORDS: Wavelets, Defect detection, Inspection, Wavelet transforms, Optical testing, Data compression, Linear filtering, Fourier transforms, Spatial resolution, Spectral resolution

Proceedings Article | 21 August 2009 Paper
Proceedings Volume 7405, 740502 (2009) https://doi.org/10.1117/12.838373
KEYWORDS: Mirrors, Reflection, Cameras, Image processing, Imaging systems, Reflectivity, Interferometers, Silicon, Phase measurement, Phase shifting

Proceedings Article | 14 August 2006 Paper
Christoph von Kopylow, Volker Kebbel, Joachim Becker, Werner Jüptner
Proceedings Volume 6292, 62920J (2006) https://doi.org/10.1117/12.681697
KEYWORDS: Wavefronts, Interferometers, Sensors, Interferometry, Optical components, Temperature metrology, CCD cameras, Beam splitters, Charge-coupled devices, Refractive index

Proceedings Article | 7 March 2006 Paper
Volker Kebbel, Hans-Juergen Hartmann, Werner Jueptner, Ulf Schnars, Laura Gatti, Joachim Becker
Proceedings Volume 4101, (2006) https://doi.org/10.1117/12.498398
KEYWORDS: Wavefronts, Interferometers, Interferometry, Sensors, Optical components, Diagnostics, Holographic interferometry, CCD cameras, Error analysis, Mirrors

Proceedings Article | 7 March 2006 Paper
Proceedings Volume 4101, (2006) https://doi.org/10.1117/12.498407
KEYWORDS: Digital holography, Holographic interferometry, Holography, Shape analysis, Holograms, Interferometry, Charge-coupled devices, Data modeling, Reconstruction algorithms, Digital recording

Showing 5 of 106 publications
Proceedings Volume Editor (12)

Showing 5 of 12 publications
Conference Committee Involvement (28)
Interferometry XVI: Techniques and Analysis
13 August 2012 | San Diego, California, United States
Interferometry XV: Techniques and Analysis
2 August 2010 | San Diego, California, United States
Interferometry XIV: Techniques and Analysis
11 August 2008 | San Diego, California, United States
Optical Measurement Systems for Industrial Inspection
18 June 2007 | Munich, Germany
Interferometry XIII: Applications
16 August 2006 | San Diego, California, United States
Showing 5 of 28 Conference Committees
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