Shortwave infrared imaging has the characteristics of high recognition and all-weather adaptation. Consequently, InGaAs short-wave infrared (SWIR) detectors find extensive applications in military and civilian fields, which imposes higher performance demands on InGaAs SWIR detectors. To optimize the performance and effectiveness of InGaAs SWIR detectors, this study delves into the fluctuation patterns of detectivity, responsivity, and dynamic range concerning integration time. Furthermore, it examines the outcomes of these parameters at various integration times. It is observed that the performance of InGaAs SWIR detectors changes at different integration times, and each parameter exhibits specific variation patterns with integration time.
The effective pixel rate is a key performance parameter of infrared focal plane detectors and is also a key parameter for assessing the reliability degradation trend of the device. The application scenario of InGaAs short wavelength infrared focal plane detectors for interstellar alignment is different from that of conventional imaging detectors, where the signal values of each pixel of the focal plane are mainly used to determine the position of the laser bright spot, rather than the gray values used to generate the image. From the point of view of blind element evaluation, for the low-orbit satellite communications application scenario, the rate of change of the response values of the image elements in each local region of the InGaAs short-wave infrared focal plane detector for interplanetary alignment with optical flux has a greater impact on the performance of the device than the absolute response values of the image elements. In order to adapt to this evaluation requirement, this work designs a sliding window blind element determination method based on the rate of change of the dark signal voltage for the intrinsic characteristics of the detector, which utilizes the principle of equivalence of the effects of luminous flux and integration time on the detector signal voltage value, which is more adaptable to the practical application scenarios of interstellar-aligned shortwave infrared focal plane detectors, and the entire focal plane is divided into a number of localized regions, and the sliding detection window is used for blind element determination, which avoids the fully aligned shortwave infrared focal plane detector. Blind meta-judgment, which avoids the phenomenon of misjudgment that often occurs in global judgment. This blind judgment method is also of great importance for the reliability evaluation of InGaAs shortwave infrared focal plane detectors with high effective pixel rate for interstellar alignment.
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