Dr. Bert Luyssaert Profile

Dr. Bert Luyssaert

at Caeleste

SPIE Involvement:

Author

Publications (2)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 30 September 2005 Paper

Silicon-on-insulator nanophotonics

Wim Bogaerts, Pieter Dumon, Patrick Jaenen, Johan Wouters, Stephan Beckx, Vincent Wiaux, Dries Van Thourhout, Dirk Taillaert, Bert Luyssaert, Roel Baets

Proceedings Volume 5956, 59560R (2005) https://doi.org/10.1117/12.624493

KEYWORDS: Waveguides, Photonic crystals, Nanophotonics, Silicon, Resonators, Oxides, Lithography, Polarization, Etching, Refractive index

Read Abstract +

Nanophotonics promise a dramatic scale reduction compared to contemporary photonic components. This allows the integration of many functions onto a chip. Silicon-on-insulator (SOI) is an ideal material for nanophotonics. It consists of a thin layer of silicon on top of an oxide buffer. In combination with high-resolution lithography, one can define a high refractive index contrast both in horizontally and vertically, resulting in a tight confinement of light. Moreover, SOI can be processed with industrial tools now used for silicon microelectronics. There are two candidates for nanophotonic waveguides. Photonic wires are basically conventional waveguides with reduced dimensions and a high refractive index contrast. These waveguides with submicron dimensions can have bend radii of only a few micrometres. The alternative is to use photonic crystals, which confine light by the photonic band gap effect. Introducing defects in a photonic crystal creates waveguides and other functional components. To make nanophotonics commercially viably, mass-manufacturing technology is needed. While e-beam lithography delivers the required accuracy for nanophotonic structures, it is too slow. We have used deep-UV lithography, used for advanced CMOS fabrication, to make nanophotonic waveguides. The fabrication quality is very good, which translates to low propagation losses. E.g. a 500nm (single-mode) photonic wire has a propagation loss of only 0.24dB/mm. Using these low-loss waveguides, we have implemented a variety of nanophotonic components, including ring resonators and arrayed waveguide gratings.

Proceedings Article | 20 October 2003 Paper

Large-scale production techniques for photonic nanostructures

Wim Bogaerts, Vincent Wiaux, Pieter Dumon, Dirk Taillaert, Johan Wouters, Stephan Beckx, Joris Van Campenhout, Bert Luyssaert, Dries Van Thourhout, Roel Baets

Proceedings Volume 5225, (2003) https://doi.org/10.1117/12.503665

KEYWORDS: Photonic crystals, Waveguides, Silicon, Etching, Oxides, Lithography, Nanophotonics, Deep ultraviolet, Semiconducting wafers, Photomasks

Read Abstract +

Nanophotonic ICs promise to play a major role in the future of opto-electronic signal processing and telecommunications. But for these devices, which consist of large numbers of wavelength-scale photonic components, to be successful, reliable and cost-effective mass-fabrication technology is needed. Photonic components, and among them photonic crystals, require a high degree of accuracy, which translates to low fabrication tolerances. Today, similar demands are made for high-end CMOS components, made of Silicon, for which a large manufacturing base is installed. We demonstrate the fabrication of nanophotonic components, like photonic crystal waveguides and photonic wires, using state-of-the-art CMOS processing tools. The foremost of these is deep UV lithography at 248nm and 193nm, combined with dry-etch processes. To maintain compatibility with standard CMOS processes, we use Silicon-on-Insulator (SOI) as our material system. SOI is transparent at telecom wavelengths and provides a good substrate for high-index contrast optical waveguides. Moreover, recent studies have shown that nanophotonic components in SOI are less sensitive to surface roughness than similar components made in III-V semiconductor. Although deep UV lithography cannot attain the resolution of e-beam lithography, this can be compensated with thorough process characterization, and the technique offers more speed because of its parallel nature. We will illustrate this with experimental results, and will also discuss some of the issues that have arisen in the course of this project.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years