Prof. Frank Schmidt
CEO at JCMwave GmbH
SPIE Involvement:
Author
Publications (65)

Proceedings Article | 16 February 2017 Presentation + Paper
N. Ledentsov, V. Shchukin, J.-R. Kropp, L. Zschiedrich, F. Schmidt
Proceedings Volume 10124, 101240O (2017) https://doi.org/10.1117/12.2253089
KEYWORDS: Dielectrics, Light emitting diodes, Semiconductors, Photonic crystals, Etching, Diodes, Distributed Bragg reflectors, Vertical cavity surface emitting lasers, Multilayers, Refractive index, Oxides, Light sources, Light, Quantum wells

Proceedings Article | 29 April 2016 Paper
Klaus Jäger, Grit Köppel, Carlo Barth, Martin Hammerschmidt, Sven Herrmann, Sven Burger, Frank Schmidt, Christiane Becker
Proceedings Volume 9898, 989808 (2016) https://doi.org/10.1117/12.2225459
KEYWORDS: Silicon, Thin film solar cells, Solar cells, Thin films, Antireflective coatings, Diffraction gratings, Numerical simulations, Finite element methods, Thin film solar cells, Refractive index, Interfaces, Polarization, Maxwell's equations, Absorption

Proceedings Article | 14 March 2016 Paper
Martin Hammerschmidt, Carlo Barth, Jan Pomplun, Sven Burger, Christiane Becker, Frank Schmidt
Proceedings Volume 9756, 97561R (2016) https://doi.org/10.1117/12.2212482
KEYWORDS: Photonic crystals, Electromagnetism, Finite element methods, Chemical elements, Electroluminescent displays, Silicon, Reflectivity, Solids, Resonance enhancement, Electromagnetic scattering

Proceedings Article | 14 March 2016 Paper
Philipp Gutsche, Lisa Poulikakos, Martin Hammerschmidt, Sven Burger, Frank Schmidt
Proceedings Volume 9756, 97560X (2016) https://doi.org/10.1117/12.2209551
KEYWORDS: Polarization, Interfaces, Electromagnetism, Electroluminescent displays, Radio propagation, Magnetism, Wave propagation, Integrated optics, Finite element methods, Anisotropy

Proceedings Article | 8 March 2016 Paper
Proceedings Volume 9778, 977839 (2016) https://doi.org/10.1117/12.2219666
KEYWORDS: Finite element methods, Electromagnetism, Computer simulations, Optical metrology, Semiconductors, Light scattering, 3D metrology, Scatterometry, Computational lithography, Numerical analysis, Silicon, Scattering, Polarization, Metrology, Maxwell's equations, Computing systems

Showing 5 of 65 publications
Conference Committee Involvement (6)
Integrated Optics: Devices, Materials, and Technologies XVIII
3 February 2014 | San Francisco, California, United States
Integrated Optics: Devices, Materials, and Technologies XVII
5 February 2013 | San Francisco, California, United States
Integrated Optics: Devices, Materials, and Technologies XVI
23 January 2012 | San Francisco, California, United States
Integrated Optics: Devices, Materials, and Technologies XV
24 January 2011 | San Francisco, California, United States
Integrated Optics: Devices, Materials, and Technologies XIV
25 January 2010 | San Francisco, California, United States
Showing 5 of 6 Conference Committees
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top