Hideki Matsui
Manager at NuFlare Technology.inc
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 25 October 2016 Paper
Hideki Matsui, Takashi Kamikubo, Satoshi Nakahashi, Haruyuki Nomura, Noriaki Nakayamada, Mizuna Suganuma, Yasuo Kato, Jun Yashima, Victor Katsap, Kenichi Saito, Ryoei Kobayashi, Nobuo Miyamoto, Munehiro Ogasawara
Proceedings Volume 9985, 998508 (2016) https://doi.org/10.1117/12.2242987
KEYWORDS: Photomasks, Lithography, Electron beams, Logic, Electron beam melting, Line edge roughness, Electron beam lithography, Extreme ultraviolet, Optical lithography, LCDs

Proceedings Article | 30 September 2009 Paper
Takashi Kamikubo, Kenji Ohtoshi, Noriaki Nakayamada, Rieko Nishimura, Hitoshi Sunaoshi, Kiminobu Akeno, Soichiro Mitsui, Yuichi Tachikawa, Hideo Inoue, Susumu Oogi, Hitoshi Higurashi, Akinori Mine, Takiji Ishimura, Seiichi Tsuchiya, Yoshitada Gomi, Hideki Matsui, Shuichi Tamamushi
Proceedings Volume 7488, 74881E (2009) https://doi.org/10.1117/12.833462
KEYWORDS: Photomasks, Data processing, Electron beams, Distributed computing, Objectives, Double patterning technology, Magnetism, Optical lithography, Overlay metrology, Lithography

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