Dr. Kevin Orvek
Senior Staff Engineer at SUNY Poly SEMATECH
SPIE Involvement:
Author
Publications (21)

Proceedings Article | 30 September 2009 Paper
Proceedings Volume 7488, 748816 (2009) https://doi.org/10.1117/12.834746
KEYWORDS: Reticles, Extreme ultraviolet, Extreme ultraviolet lithography, Overlay metrology, Error analysis, Scanners, Semiconducting wafers, Distortion, Photomasks, Wafer-level optics

Proceedings Article | 27 May 2009 Paper
Proceedings Volume 7470, 747005 (2009) https://doi.org/10.1117/12.835796
KEYWORDS: Photomasks, Extreme ultraviolet, Extreme ultraviolet lithography, Particles, Polishing, Surface finishing, Ion beams, Etching, Anisotropic etching, Manufacturing

Proceedings Article | 11 May 2009 Paper
Proceedings Volume 7379, 73790Q (2009) https://doi.org/10.1117/12.824267
KEYWORDS: Photomasks, Scanners, Semiconducting wafers, Extreme ultraviolet lithography, Finite element methods, Extreme ultraviolet, Polishing, Distortion, Overlay metrology, Optical alignment

Proceedings Article | 11 May 2009 Paper
Proceedings Volume 7379, 73790G (2009) https://doi.org/10.1117/12.824257
KEYWORDS: Photomasks, Particles, Extreme ultraviolet, Extreme ultraviolet lithography, Inspection, Lithography, Deposition processes, Defect inspection, Surface roughness, Manufacturing

Proceedings Article | 18 March 2009 Paper
Long He, John Lystad, Stefan Wurm, Kevin Orvek, Jaewoong Sohn, Andy Ma, Patrick Kearney, Steve Kolbow, David Halbmaier
Proceedings Volume 7271, 72710I (2009) https://doi.org/10.1117/12.814304
KEYWORDS: Reticles, Extreme ultraviolet, Inspection, Photomasks, Particles, Extreme ultraviolet lithography, Silica, Semiconducting wafers, Standards development, Contamination

Showing 5 of 21 publications
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