Dr. John G. Hartley
Fellow at NuFlare Technology USA
SPIE Involvement:
Author
Publications (22)

Proceedings Article | 29 September 2021 Presentation
Tadayuki Sugimori, Riki Ogawa, Hidekazu Takekoshi, John Hartley, David Pinkney, Atsushi Ando, Koichi Ishii, Chosaku Noda, Nobutaka Kikuiri
Proceedings Volume 11855, 118550C (2021) https://doi.org/10.1117/12.2600987
KEYWORDS: Inspection, Extreme ultraviolet, Photomasks, Optical inspection, Optics manufacturing, EUV optics, Wafer-level optics, Image processing, Extreme ultraviolet lithography, Deep ultraviolet

Proceedings Article | 23 August 2021 Paper
Tadayuki Sugimori, Riki Ogawa, Hidekazu Takekoshi, John Hartley, David Pinckney, Atsushi Ando, Koichi Ishii, Chosaku Noda, Nobutaka Kikuiri
Proceedings Volume 11908, 119080J (2021) https://doi.org/10.1117/12.2598235

Proceedings Article | 22 February 2021 Poster + Presentation + Paper
Hidekazu Takekoshi, Riki Ogawa, John Hartley, David Pinckeny, Atsushi Ando, Koichi Ishii, Chosaku Noda, Tadayuki Sugimori, Nobutaka Kikuiri
Proceedings Volume 11611, 116112N (2021) https://doi.org/10.1117/12.2583613
KEYWORDS: Photomasks, Extreme ultraviolet, Optics manufacturing, Inspection, EUV optics, Defect inspection, Extreme ultraviolet lithography, Semiconductor manufacturing, Optical systems, Optical inspection

Proceedings Article | 28 March 2014 Paper
James Smith, Nigel Crosland, Samuel Doran, Robert Dowling, John Hartley, Philip Hoyle, David M. King, Lawrence Kutcher, Andrew McClelland, Martin Turnidge
Proceedings Volume 9049, 90490O (2014) https://doi.org/10.1117/12.2046609
KEYWORDS: Lithography, Double patterning technology, Analog electronics, Clocks, Photomicroscopy, Beam shaping, Computer programming, Semiconducting wafers, Metals, Metrology

Proceedings Article | 26 March 2013 Paper
John Hartley, Nigel Crosland, Robert Dowling, Philip Hoyle, Andrew McClelland, Martin Turnidge, James Smith
Proceedings Volume 8680, 86800P (2013) https://doi.org/10.1117/12.2011664
KEYWORDS: Lithography, Semiconducting wafers, Zone plates, Computer programming, Beam shaping, Data conversion, Metals, Photomicroscopy, Metrology, Time metrology

Showing 5 of 22 publications
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