Ms. Yoke Chin Goh Profile

Yoke Chin Goh

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Publications (3)

Proceedings Article | 3 October 2008 Paper

Whole field residual stress measurement using computer aided reflection grating

Chi Seng Ng, Yoke Chin Goh, Anand Asundi

Proceedings Volume 7155, 71552C (2008) https://doi.org/10.1117/12.814586

KEYWORDS: Semiconducting wafers, Reflection, Wafer-level optics, LCDs, Modulation, Beam splitters, Image analysis, Image processing, Image quality, Optics manufacturing

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Proceedings Article | 11 September 2007 Paper

Warpage of thin wafers using computer aided reflection moire method

Chi Seng Ng, Kok Yau Chua, Meng Tong Ong, Yoke Chin Goh, Anand Asundi

Proceedings Volume 6672, 667203 (2007) https://doi.org/10.1117/12.732783

KEYWORDS: Semiconducting wafers, Metals, LCDs, Packaging, Silicon, Beam splitters, Visualization, Reflection, Moire patterns, Analytical research

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Proceedings Article | 14 August 2006 Paper

Investigation of inherent wafer defects using reflection grating technique

Anand Asundi, Meng Tong Ong, Yoke Chin Goh, Teng Yong Khoo, Shen Fah Loo

Proceedings Volume 6293, 62930E (2006) https://doi.org/10.1117/12.679830

KEYWORDS: Semiconducting wafers, Gold, Phase shifts, LCDs, Beam splitters, Metals, Image processing, Reflectivity, Cameras, Aerospace engineering

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